Patents by Inventor Arthur W. Mario

Arthur W. Mario has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning X-ray inspection system using scintillation detection with simultaneous counting and integrating modes
    Patent number: 7965816
    Abstract: X-ray radiation is transmitted through and scattered from an object under inspection to detect weapons, narcotics, explosives or other contraband. Relatively fast scintillators are employed for faster X-ray detection efficiency and significantly improved image resolution. Scatter and transmission images of the object are displayed, at least one being colorized in accordance with the effective atomic number of constituents of the object. Soft switching between photon-counting and photon integration modes reduces noise and significantly increases overall image quality.
    Type: Grant
    Filed: August 10, 2009
    Date of Patent: June 21, 2011
    Assignee: Control Screening, LLC.
    Inventors: Scott D. Kravis, Karl E. Geisel, Karl Voigtland, Arthur W. Mario
  • Scanning X-ray inspection system using scintillation detection with simultaneous counting and integrating modes
    Publication number: 20100034353
    Abstract: X-ray radiation is transmitted through and scattered from an object under inspection to detect weapons, narcotics, explosives or other contraband. Relatively fast scintillators are employed for faster X-ray detection efficiency and significantly improved image resolution. Scatter and transmission images of the object are displayed, at least one being colorized in accordance with the effective atomic number of constituents of the object. Soft switching between photon-counting and photon integration modes reduces noise and significantly increases overall image quality.
    Type: Application
    Filed: August 10, 2009
    Publication date: February 11, 2010
    Inventors: Scott D. Kravis, Karl E. Geisel, Karl Voigtland, Arthur W. Mario
  • Tomographic scanning X-ray inspection system using transmitted and Compton scattered radiation
    Patent number: 7072440
    Abstract: X-ray radiation is transmitted through and scattered from an object under inspection to detect weapons, narcotics, explosives or other contraband. Relatively fast scintillators are employed for faster X-ray detection efficiency and significantly improved image resolution. Detector design is improved by the use of optically adiabatic scintillators. Switching between photon-counting and photon integration modes reduces noise and significantly increases overall image quality.
    Type: Grant
    Filed: November 12, 2003
    Date of Patent: July 4, 2006
    Assignee: Control Screening, LLC
    Inventors: Arthur W. Mario, Scott D. Kravis
  • Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation
    Patent number: 6661867
    Abstract: X-ray radiation is transmitted through and scattered from an object under inspection to detect weapons, narcotics, explosives or other contraband. Relatively fast scintillators are employed for faster X-ray detection efficiency and significantly improved image resolution. Detector design is improved by the use of optically adiabatic scintillators. Switching between photon-counting and photon integration modes reduces noise and significantly increases overall image quality.
    Type: Grant
    Filed: October 19, 2001
    Date of Patent: December 9, 2003
    Assignee: Control Screening, LLC
    Inventors: Arthur W. Mario, Scott D. Kravis
  • Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation
    Publication number: 20030076924
    Abstract: X-ray radiation is transmitted through and scattered from an object under inspection to detect weapons, narcotics, explosives or other contraband. Relatively fast scintillators are employed for faster X-ray detection efficiency and significantly improved image resolution. Detector design is improved by the use of optically adiabatic scintillators. Switching between photon-counting and photon integration modes reduces noise and significantly increases overall image quality.
    Type: Application
    Filed: October 19, 2001
    Publication date: April 24, 2003
    Inventors: Arthur W. Mario, Scott D. Kravis