Abstract: An integrated circuit is described. This integrated circuit may include: a receive circuit, coupled to a segment of a LIN bus, that receives bits; a measurement circuit, coupled to the receive circuit, that measures: a rising-edge time and a falling-edge time in the bits, or a bit time and a second bit time in the bits; control logic, coupled to the measurement circuit, that compares the rising-edge time and the falling-edge time, or the bit time and the second bit time; a transmit circuit, coupled to the receive circuit, that transmits the bits on a second segment of the LIN bus; and a delay circuit, coupled to the control logic, that applies, based at least in part on the comparison, a delay to: one or more rising edges or falling edges in the bits; or one or more bit times or second bit times in the bits.