Abstract: This application discloses a computing system implementing a functional safety validation tool to simulate an integrated circuit design with a stimulus vector. The computing system can inject a fault at a first node of the simulated integrated circuit design, which prompts alarm logic to trigger indicating a detection of the injected fault. The computing system, in response to the triggering of the alarm logic, can initiate back-propagation to identify which intermediate nodes of the simulated integrated circuit design, located between the first node and the alarm logic, have fault values that prompt the alarm logic to trigger. The computing system can generate a fault coverage presentation identifying a diagnostic coverage of the alarm logic for the stimulus vector based on when the alarm logic.

Abstract: A computing system implementing a functional safety validation tool to simulate a circuit design having a digital portion and an analog portion, and inject a fault into the digital portion of a simulated circuit design, which propagates towards alarm logic configured to detect the injected fault. When the injected fault propagates to a boundary between the digital portion and the analog portion, the functional safety validation tool can perform a parallel simulation of the analog portion, which propagates the injected fault from the boundary through the analog portion to an output. The functional safety validation tool can determine whether the analog portion of the circuit design suppresses the injected fault based on a value at the output. The functional safety validation tool can generate a fault coverage presentation identifying a diagnostic coverage of the alarm logic based on whether the injected fault was suppressed.

Abstract: A method is provided for analyzing failure rates due to soft/hard errors in the design of a digital electronic device. The method includes creating an error injection point by introducing a fault into a code path having a plurality of levels; determining an error detection point at which the introduced fault becomes detectable; creating a list of all of the logic cells forming the cone of logic that forms the data input to the error detection point, thereby generating a first logic cone list; creating a list of all of the logic cells forming the cone of logic that forms the data input to the error injection point, thereby generating a second logic cone list; determining the intersection between the first and second logic cone lists; and conducting a failure rate analysis on the intersection between the first and second logic cone lists.

Abstract: A method is provided for analyzing failure rates due to soft/hard errors in the design of a digital electronic device. The method includes creating an error injection point by introducing a fault into a code path having a plurality of levels; determining an error detection point at which the introduced fault becomes detectable; creating a list of all of the logic cells forming the cone of logic that forms the data input to the error detection point, thereby generating a first logic cone list; creating a list of all of the logic cells forming the cone of logic that forms the data input to the error injection point, thereby generating a second logic cone list; determining the intersection between the first and second logic cone lists; and conducting a failure rate analysis on the intersection between the first and second logic cone lists.