Patents by Inventor Arun Kumar Reddy

Arun Kumar Reddy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120258598
    Abstract: A chemical mechanical polishing composition, comprising, as initial components: water; 0.1 to 20 wt % abrasive having an average particle size of 5 to 50 nm; and, 0.001 to 1 wt % of an adamantyl substance according to formula (II): wherein A is selected from N and P; wherein each R8 is independently selected from hydrogen, a saturated or unsaturated C1-15 alkyl group, C6-15 aryl group, C6-15 aralkyl group, C6-15 alkaryl group; and, wherein the anion in formula (II) can be any anion that balances the positive charge on the cation in formula (II).
    Type: Application
    Filed: June 12, 2012
    Publication date: October 11, 2012
    Applicant: Rohm and Haas Electronic Materials CMP Holdings, Inc.
    Inventors: Yi Guo, Zhendong Liu, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Patent number: 8232208
    Abstract: A chemical mechanical polishing composition, comprising, as initial components: water; 0.1 to 40 wt % abrasive having an average particle size of 5 to 150 nm; 0.001 to 1 wt % of an adamantyl substance according to formula (II); 0 to 1 wt % diquaternary substance according to formula (I); and, 0 to 1 wt % of a quaternary ammonium compound. Also, provided is a method for chemical mechanical polishing using the chemical mechanical polishing composition.
    Type: Grant
    Filed: June 15, 2010
    Date of Patent: July 31, 2012
    Assignee: Rohm and Haas Electronic Materials CMP Holdings, Inc.
    Inventors: Yi Guo, Zhendong Liu, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Publication number: 20120070990
    Abstract: A chemical mechanical polishing slurry composition, comprising, as initial components: water; an abrasive; a halogenated quaternary ammonium compound according to formula (I), wherein R8 is selected from a C1-10 alkyl group and a C1-10 hydroxyalkyl group; wherein X1 is a halide selected from chloride, bromide, iodide and fluoride; wherein R9, R10 and R11 are each independently selected from a saturated or unsaturated C1-10 alkyl group, a C1-10 haloalkyl group, a C6-15 aryl group, a C6-15 haloaryl group, a C6-15 arylalkyl group and a C6-15 haloarylalkyl; and, wherein the anion in formula (I) can be any anion that balances the + charge on the cation in formula (I); and, optionally, a diquaternary substance according to formula (II), wherein each A is independently selected from N and P; wherein R1 is selected from a saturated or unsaturated C1-C15 alkyl group, a C6-C15 aryl group and a C6-C15 aralkyl group; wherein R2, R3, R4, R5, R6 and R7 are each independently selected from selected from a hydrogen, a satura
    Type: Application
    Filed: September 22, 2010
    Publication date: March 22, 2012
    Inventors: Zhendong Liu, Yi Guo, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Publication number: 20120070989
    Abstract: A chemical mechanical polishing composition, comprising, as initial components: water; an abrasive; a diquaternary substance according to formula (I), wherein each X is independently selected from N and P; wherein R1 is selected from a saturated or unsaturated C1-C15 alkyl group, a C6-C15 aryl group and a C6-C15 aralkyl group; wherein R2, R3, R4, R5, R6 and R7 are each independently selected from selected from a hydrogen, a saturated or unsaturated C1-C15 alkyl group, a C6-C15 aryl group, a C6-C15 aralkyl group and a C6-C15 alkaryl group; and, wherein the anion in formula (I) can be any anion or combination of anions that balance the 2+ charge on the cation in formula (I); a derivative of guanidine according to formula (II), wherein R8 is selected from a hydrogen, a saturated or unsaturated C1-C15 alkyl group, a C6-C15 aryl group, a C6-C15 aralkyl group and a C6-C15 alkaryl group; wherein R9, R10, R11 and R12 are each independently selected from a hydrogen, a saturated or unsaturated C1-C15 alkyl group, a C6-
    Type: Application
    Filed: September 20, 2010
    Publication date: March 22, 2012
    Inventors: Zhendong Liu, Yi Guo, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Publication number: 20120003834
    Abstract: The invention provides a method for chemical mechanical polishing of a substrate. The invention comprises providing a substrate, wherein the substrate comprises a chalcogenide phase change alloy and providing a chemical mechanical polishing composition, wherein the chemical mechanical polishing composition comprises, by weight percent, water, 0.1 to 30 abrasive, at least one polishing agent selected from 0.05 to 5 halogen compound, 0.05 to 5 phthalic acid, 0.05 to 5 phthalic anhydride and salts, derivatives and mixtures thereof and wherein the chemical mechanical polishing composition has a pH of 2 to less than 7. A chemical mechanical polishing pad polishes the substrate with the chemical mechanical polishing pad and the chemical mechanical polishing composition to selectively or non-selectively remove the chalcogenide phase change alloy from the substrate.
    Type: Application
    Filed: July 1, 2010
    Publication date: January 5, 2012
    Inventors: Ja-Ho Koo, Zhendong Liu, Kaveri Sawant, Kancharla-Arun Kumar Reddy
  • Publication number: 20120001118
    Abstract: The invention provides a chemical mechanical polishing composition for chemical mechanical polishing of a chalcogenide phase change alloy substrate. The composition comprises by weight percent, water, 0.1 to 30 colloidal silica abrasive, at least one polishing agent selected from 0.05 to 5 halogen compound, 0.05 to 5 phthalic acid, 0.05 to 5 phthalic anhydride and salts, derivatives and mixtures thereof. The chemical mechanical polishing composition has a pH of 2 to less than 7.
    Type: Application
    Filed: July 1, 2010
    Publication date: January 5, 2012
    Inventors: Ja-Ho Koo, Kaveri Sawant, Zhendong Liu, Kancharla-Arun Kumar Reddy
  • Publication number: 20110306211
    Abstract: A chemical mechanical polishing composition, comprising, as initial components: water; 0.1 to 40 wt % abrasive having an average particle size of 5 to 150 nm; 0.001 to 1 wt % of an adamarityl substance according to formula (II); 0 to 1 wt % diquaternary substance according to formula (I); and, 0 to 1 wt % of a quaternary ammonium compound. Also, provided is a method for chemical mechanical polishing using the chemical mechanical polishing composition.
    Type: Application
    Filed: June 15, 2010
    Publication date: December 15, 2011
    Inventors: Yi Guo, Zhendong Liu, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Publication number: 20110244685
    Abstract: A method for chemical mechanical polishing of a substrate is provided, comprising: providing a substrate, wherein the substrate comprises silicon oxide; providing a chemical mechanical polishing composition, comprising, as initial components: water; an abrasive; and a substance according to formula I wherein R1, R2 and R3 are each independently selected from a C1-4 alky group; providing a chemical mechanical polishing pad with a polishing surface; moving the polishing surface relative to the substrate; dispensing the chemical mechanical polishing composition onto the polishing surface; and, abrading at least a portion of the substrate to polish the substrate; wherein the substance according to formula I included in the chemical mechanical polishing composition provides an enhanced silicon oxide removal rate and an improved polishing defectivity performance; and, wherein at least some of the silicon oxide is removed from the substrate.
    Type: Application
    Filed: March 31, 2010
    Publication date: October 6, 2011
    Inventors: Yi Guo, Zhendong Liu, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Patent number: 8025813
    Abstract: A chemical mechanical polishing composition useful for chemical mechanical polishing of a substrate, wherein the substrate comprises a silicon oxide material and a silicon nitride material; and methods of making and using the chemical mechanical polishing composition. The chemical mechanical polishing composition comprises, as initial components: at least one of a first substance and a second substance; wherein the first substance is according to formula I wherein the second substance is according to formula II an abrasive; and water.
    Type: Grant
    Filed: November 12, 2009
    Date of Patent: September 27, 2011
    Assignee: Rohm and Haas Electronic Materials CMP Holdings, Inc.
    Inventors: Zhendong Liu, Yi Guo, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Publication number: 20110230049
    Abstract: A method for chemical mechanical polishing of a substrate is provided, comprising: providing a substrate, wherein the substrate comprises polysilicon and at least one of silicon oxide and silicon nitride; providing a chemical mechanical polishing composition, comprising, as initial components: water; an abrasive; and an acyclic organosulfonic acid compound, wherein the acyclic organosulfonic acid compound has an acyclic hydrophobic portion having 6 to 30 carbon atoms and a nonionic acyclic hydrophilic portion having 10 to 300 carbon atoms; providing a chemical mechanical polishing pad with a polishing surface; moving the polishing surface relative to the substrate; dispensing the chemical mechanical polishing composition onto the polishing surface; and, abrading at least a portion of the substrate to polish the substrate; wherein at least some of the polysilicon is removed from the substrate; and, wherein at least some of the at least one of silicon oxide and silicon nitride is removed from the substrate.
    Type: Application
    Filed: March 16, 2010
    Publication date: September 22, 2011
    Inventors: Yi Guo, Zhendong Liu, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Publication number: 20110230050
    Abstract: A method for chemical mechanical polishing of a substrate is provided, comprising: providing a substrate, wherein the substrate comprises polysilicon and at least one of silicon oxide and silicon nitride; providing a chemical mechanical polishing composition, comprising, as initial components: water; an abrasive; and an alkyl aryl polyether sulfonate compound, wherein the alkyl aryl polyether sulfonate compound has a hydrophobic portion having an alkyl group bound to an aryl ring and a nonionic acyclic hydrophilic portion having 4 to 100 carbon atoms; providing a chemical mechanical polishing pad with a polishing surface; moving the polishing surface relative to the substrate; dispensing the chemical mechanical polishing composition onto the polishing surface; and, abrading at least a portion of the substrate to polish the substrate; wherein at least some of the polysilicon is removed from the substrate; and, wherein at least some of the at least one of silicon oxide and silicon nitride is removed from the su
    Type: Application
    Filed: March 16, 2010
    Publication date: September 22, 2011
    Inventors: Yi Guo, Zhendong Liu, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Publication number: 20110230048
    Abstract: A method for chemical mechanical polishing of a substrate is provided, comprising: providing a substrate, wherein the substrate comprises polysilicon, silicon oxide and silicon nitride; providing a chemical mechanical polishing composition, comprising, as initial components: water; an abrasive; an alkyl aryl polyether sulfonate compound, wherein the alkyl aryl polyether sulfonate compound has a hydrophobic portion having an alkyl group bound to an aryl ring and a nonionic acyclic hydrophilic portion having 4 to 100 carbon atoms; and a substance according to formula I wherein each of R1, R2, R3, R4, R5, R6 and R7 is a bridging group having a formula —(CH2)n—, wherein n is an integer selected from 1 to 10; providing a chemical mechanical polishing pad with a polishing surface; moving the polishing surface relative to the substrate; dispensing the chemical mechanical polishing composition onto the polishing surface; and, abrading at least a portion of the substrate to polish the substrate; wherein at least s
    Type: Application
    Filed: March 16, 2010
    Publication date: September 22, 2011
    Inventors: Yi Guo, Zhendong Liu, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Publication number: 20110111595
    Abstract: A chemical mechanical polishing composition useful for chemical mechanical polishing of a substrate, wherein the substrate comprises a silicon oxide material and a silicon nitride material; and methods of making and using the chemical mechanical polishing composition. The chemical mechanical polishing composition comprises, as initial components: at least one of a first substance and a second substance; wherein the first substance is according to formula I wherein the second substance is according to formula II an abrasive; and water.
    Type: Application
    Filed: November 12, 2009
    Publication date: May 12, 2011
    Inventors: Zhendong Liu, Yi Guo, Kancharla-Arun Kumar Reddy, Guangyun Zhang
  • Publication number: 20100070556
    Abstract: Methods, systems, and apparatus, including computer program products, for implementing a software architecture design for a software application implementing data migration. The application is structured as multiple process components interacting with each other through service interfaces, and multiple service operations, each being implemented for a respective process component. The process components include a Product Property Management process component, a Production Model Management process component, a Business Partner Data Management process component, a Product Data Maintenance process component, an Installed Base Data Management process component, a Price Master Data Management process component, an Identity Management process component, an Engineering Change Processing process component, a Migration Data Dispatching process component, and several other process components.
    Type: Application
    Filed: September 18, 2008
    Publication date: March 18, 2010
    Inventors: Knut Heusermann, Volker Schott, Roland Kaschner, Sandra Fischbach, Henry Borreill, Rene Dehn, Guillaume Duchene, Olivier Ficatier, Stefano Gagliardi, Axel Haury, Ebru Polat, Jochen Schmitt, Lutz Rosenpflanzer, Michael Jung, Tao Yu, Dietmar Storz, Christof Weissenberger, Gururaj Raman, Simon Dieterich, Alexandra Mark, Arun Kumar Reddy, Steffen Tatzel, Ralph Meiswinkel, Christian Haas, Andrea Sudbrack, Joachim Barnbeck, Sabine Lamprecht, Achim Enenkiel, Jan Gabriel, Mathias Sonnek, Jan Rumig, Stephan Heinz, Yongbin He, Achim Heger, Andreas Reccius, Panagiotis Kokkalis, Thomas Vogt, Heiko Steffen, Christian Boehrer, Benjamin Klehr, Simone Jorda, Rene Le Maire, Shailaja Police Patil, Klaus Groth, Klaus Reinelt, Yaron Livneh, Petra Meyer, Michael Hartel, Karsten Kimme, Benjamin Ringl, Ahmed Ali Shah, Reiner Bildmayer, Gesa Westberg, Monika Morey, Dirk Rohdemann