Patents by Inventor Arun S. Iyer

Arun S. Iyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10247770
    Abstract: Various embodiments of a gate oxide breakdown detection technique detect gate oxide degradation due to stress on a per part basis without destroying functional circuits for an intended application. Stress on the gate oxide may be applied while nominal drain currents flow through a device, thereby stressing the device under conditions similar to actual operating conditions. The technique is relatively fast and does not require analog amplifiers or tuning of substantial amounts of other additional circuitry as compared to conventional gate oxide breakdown detection techniques.
    Type: Grant
    Filed: December 16, 2016
    Date of Patent: April 2, 2019
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Abhay Deshpande, Arun S. Iyer, Prasanth K. Vallur, Girish Anathahally Singrigowda, Stephen V. Kosonocky
  • Publication number: 20180172753
    Abstract: Various embodiments of a gate oxide breakdown detection technique detect gate oxide degradation due to stress on a per part basis without destroying functional circuits for an intended application. Stress on the gate oxide may be applied while nominal drain currents flow through a device, thereby stressing the device under conditions similar to actual operating conditions. The technique is relatively fast and does not require analog amplifiers or tuning of substantial amounts of other additional circuitry as compared to conventional gate oxide breakdown detection techniques.
    Type: Application
    Filed: December 16, 2016
    Publication date: June 21, 2018
    Inventors: Abhay Deshpande, Arun S. Iyer, Prasanth K. Vallur, Girish Anathahally Singrigowda, Stephen V. Kosonocky
  • Patent number: 9494649
    Abstract: An integrated circuit (IC) measures uncertainties in a first signal. The IC comprises a programmable delay circuit to introduce a programmable delay to the first signal to generate a first delayed signal. The IC further comprises a digital delay line (DDL) comprising a first delay chain of delay elements having input to receive the first delayed signal. The DDL further comprises a set of storage elements, each storage element having an input coupled to an output of a corresponding delay element of the first delay chain, and an output to provide a corresponding bit of a digital reading. The DDL additionally comprises a decoder to generate a digital signature from the digital reading and a controller to iteratively adjust the programmed delay of the programmable delay circuit to search for a failure in a resulting digital signature.
    Type: Grant
    Filed: December 31, 2012
    Date of Patent: November 15, 2016
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Arun S. Iyer, Prashanth Vallur, Shraddha Padiyar, Amit Govil
  • Patent number: 9317613
    Abstract: A system and method is described for large scale entity-specific classification of each entity-specific set of candidates in a collection of candidates for each specific entity in a collection of entities. The collection of entities may comprise a specific category or domain of entities (e.g. schools, restaurants, manufacturers, products, events, people). Candidates may comprise webpages or other resources with resource identifiers. Entity specific sets of candidates may be found by leveraging search engine query results and user interaction therewith for queries based on entity-specific attributes. The relationship(s) or class(es) for which candidate resources are being classified relative to a specific entity may comprise an authoritative, official home page (OHP), or other class (e.g. fan page, review, aggregator) relative to a specific entity. A feature generator generates entity-specific features for candidates.
    Type: Grant
    Filed: April 21, 2010
    Date of Patent: April 19, 2016
    Assignee: Yahoo! Inc.
    Inventors: Sathiya K. Selvaraj, Philip L. Bohannon, Mridul Muralidharan, Cong Yu, Ashwin Machanavajjhala, Arun S. Iyer, Sundararajan Sellamanickam
  • Publication number: 20140184243
    Abstract: An integrated circuit (IC) measures uncertainties in a first signal. The IC comprises a programmable delay circuit to introduce a programmable delay to the first signal to generate a first delayed signal. The IC further comprises a digital delay line (DDL) comprising a first delay chain of delay elements having input to receive the first delayed signal. The DDL further comprises a set of storage elements, each storage element having an input coupled to an output of a corresponding delay element of the first delay chain, and an output to provide a corresponding bit of a digital reading. The DDL additionally comprises a decoder to generate a digital signature from the digital reading and a controller to iteratively adjust the programmed delay of the programmable delay circuit to search for a failure in a resulting digital signature.
    Type: Application
    Filed: December 31, 2012
    Publication date: July 3, 2014
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Arun S. Iyer, Prashanth Vallur, Shraddha Padiyar, Amit Govil
  • Publication number: 20110264651
    Abstract: A system and method is described for large scale entity-specific classification of each entity-specific set of candidates in a collection of candidates for each specific entity in a collection of entities. The collection of entities may comprise a specific category or domain of entities (e.g. schools, restaurants, manufacturers, products, events, people). Candidates may comprise webpages or other resources with resource identifiers. Entity specific sets of candidates may be found by leveraging search engine query results and user interaction therewith for queries based on entity-specific attributes. The relationship(s) or class(es) for which candidate resources are being classified relative to a specific entity may comprise an authoritative, official home page (OHP), or other class (e.g. fan page, review, aggregator) relative to a specific entity. A feature generator generates entity-specific features for candidates.
    Type: Application
    Filed: April 21, 2010
    Publication date: October 27, 2011
    Applicant: YAHOO! INC.
    Inventors: Sathiya K. Selvaraj, Philip L. Bohannon, Mridul Muralidharan, Cong Yu, Ashwin Machanavajjhala, Arun S. Iyer, Sundararajan Sellamanickam