Patents by Inventor Arun TIWARI

Arun TIWARI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240193471
    Abstract: Various embodiments of the present disclosure disclose machine-learning based evaluation techniques for detecting feature bias. An evaluation framework is provided that utilizes new evaluation data structures for comprehensibly evaluating feature bias in machine learning models. The evaluation framework includes receiving evaluation dataset for a machine learning model that includes one or more different feature classes of an evaluation feature. The evaluation framework includes generating, using an evaluation function, at least two performance metrics for the machine learning model and generating a unitless dissimilarity metric for the evaluation feature based at least in part on the first performance metric, the second performance metric, and an average between the first and second performance metrics. In this way, the unitless dissimilarity metric is based on a variability associated with the evaluation feature.
    Type: Application
    Filed: December 8, 2022
    Publication date: June 13, 2024
    Inventors: Arun Tiwari, Amardeep Sharma, Rahul Pathak, Sudhanshu Sharma, Urvi Sharma, Radhika Agarwal
  • Publication number: 20240193470
    Abstract: Various embodiments of the present disclosure disclose machine-learning based evaluation techniques for detecting feature bias. An evaluation framework is provided that utilizes new evaluation data structures for comprehensibly evaluating feature bias in machine learning models. The evaluation framework includes receiving evaluation dataset for a machine learning model that includes one or more different feature classes of an evaluation feature. The evaluation framework includes generating, using an evaluation function, at least two performance metrics for the machine learning model and generating a unitless dissimilarity metric for the evaluation feature based at least in part on the first performance metric, the second performance metric, and an average between the first and second performance metrics. In this way, the unitless dissimilarity metric is based on a variability associated with the evaluation feature.
    Type: Application
    Filed: December 8, 2022
    Publication date: June 13, 2024
    Inventors: Arun Tiwari, Amardeep Sharma, Rahul Pathak, Sudhanshu Sharma, Urvi Sharma, Radhika Agarwal
  • Patent number: 10394767
    Abstract: A method of computing relative rankings for multiple course trajectories may include accessing a data structure. The data structure may include a first node that may represent a first course and a plurality of nodes that may represent courses that are available after completing the first course. Each of the plurality of nodes may be associated with a weight, and the plurality of nodes may include a second node representing a second course. The method may also include receiving a first grade for a student for the first course and receiving a second grade for the student for the second course. The method may additionally include adjusting the weight associated with the second node using the first grade and the second grade. The method may further include providing a ranking of the plurality of courses using the weights of the plurality of courses.
    Type: Grant
    Filed: March 14, 2013
    Date of Patent: August 27, 2019
    Assignee: ORACLE INTERNATIONAL CORPORATION
    Inventors: Amit Bhalla, Parag Awadhiya, Arun Tiwari
  • Publication number: 20140280205
    Abstract: A method of computing relative rankings for multiple course trajectories may include accessing a data structure. The data structure may include a first node that may represent a first course and a plurality of nodes that may represent courses that are available after completing the first course. Each of the plurality of nodes may be associated with a weight, and the plurality of nodes may include a second node representing a second course. The method may also include receiving a first grade for a student for the first course and receiving a second grade for the student for the second course. The method may additionally include adjusting the weight associated with the second node using the first grade and the second grade. The method may further include providing a ranking of the plurality of courses using the weights of the plurality of courses.
    Type: Application
    Filed: March 14, 2013
    Publication date: September 18, 2014
    Applicant: ORACLE INTERNATIONAL CORPORATION
    Inventors: Amit BHALLA, Parag AWADHIYA, Arun TIWARI