Abstract: A method and system for combining the process variations in circuits and distributed interconnect-based electromagnetic (EM) objects in order to capture a statistical behavior of overall circuit performance parameters. In an exemplary approach, a coupled circuit-EM system is decoupled at the points where the EM objects connect to the circuit portion, and circuit ports are defined at those points. The sources of variation are identified and used to determine Y-parameters for the ports with EM elements and for all EM elements based on the SPICE-like and EM full-wave simulations. A response surface is generated for each variable and is used to extract circuit and EM parameters by generating many random vectors representing combinations of the random variables. These Y-parameters are merged to produce a probability density function (PDF) of one or more performance metrics for the electronic device or system.

Abstract: A method and system for combining the process variations in circuits and distributed interconnect-based electromagnetic (EM) objects in order to capture a statistical behavior of overall circuit performance parameters. In an exemplary approach, a coupled circuit-EM system is decoupled at the points where the EM objects connect to the circuit portion, and circuit ports are defined at those points. The sources of variation are identified and used to determine Y-parameters for the ports with EM elements and for all EM elements based on the SPICE-like and EM full-wave simulations. A response surface is generated for each variable and is used to extract circuit and EM parameters by generating many random vectors representing combinations of the random variables. These Y-parameters are merged to produce a PDF of one or more performance metrics for the electronic device or system.