Patents by Inventor Arunav Rath

Arunav Rath has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10324827
    Abstract: The present disclosure relates to a method and device for automatically generating test data for testing software applications. In one embodiment, a plurality of test cases associated with test scenarios is determined by analyzing requirements of the software applications. The plurality of test cases is then processed to generate a plurality of test data scripts that are further executed on a first data source to obtain the test data. If it is determined that the execution of the plurality of test cases fail, then the plurality of test data scripts is executed on a second data source to obtain the test data. The first data source is then updated with the test data obtained for future test data requirements. Thus, the technology enables automatic generation of test data obtained from external data sources and thereby improving the testing efficiency and quality of the applications being tested.
    Type: Grant
    Filed: February 9, 2017
    Date of Patent: June 18, 2019
    Assignee: Wipro Limited
    Inventors: Gopalan Sathiya Narayanan, Arunav Rath
  • Publication number: 20180095866
    Abstract: The present disclosure relates to a method and device for automatically generating test data for testing software applications. In one embodiment, a plurality of test cases associated with test scenarios is determined by analyzing requirements of the software applications. The plurality of test cases is then processed to generate a plurality of test data scripts that are further executed on a first data source to obtain the test data. If it is determined that the execution of the plurality of test cases fail, then the plurality of test data scripts is executed on a second data source to obtain the test data. The first data source is then updated with the test data obtained for future test data requirements. Thus, the technology enables automatic generation of test data obtained from external data sources and thereby improving the testing efficiency and quality of the applications being tested.
    Type: Application
    Filed: February 9, 2017
    Publication date: April 5, 2018
    Inventors: Gopalan Sathiya Narayanan, Arunav Rath