Abstract: A scanner is configured to scan the emitted light through a window. A first detector is positioned to receive at least a portion of the emitted light scattered by a downrange target. A second detector is positioned to receive at least a portion of the emitted light scattered by a window obscurant. A third detector is positioned to receive at least a portion of the emitted light scattered by a close obscurant located within a distance range that is between a minimum detection distance associated with the first detector and a maximum detection distance associated with the second detector. A processor is configured to determine whether an obscurant located closer to the window than the minimum detection distance associated with the first detector is detected based on one or more signal properties of the second detector and one or more signal properties of the third detector.

Abstract: A lidar system is disclosed. The system comprises a light source configured to emit light pulses. The system comprises a scanner configured to scan the emitted light pulses across an internal reference target internal to the system. The system comprises a detector configured to detect light that is at least a portion of light scattered by the internal reference target from at least a portion of the emitted light pulses. The system comprises a processor configured to selectively gather detected optical property values of the detected light corresponding to a selective portion of the emitted light pulses scanned across the internal reference target and use the selectively gathered detected optical property values to determine one or more calibration values.

Abstract: A system comprises a light source, a scanner, a reference reflectivity material, a detector, and a processor. The light source is configured to emit light, and the scanner is configured to scan the emitted light across at least a portion of a reachable region including a field of regard through a window. The reference reflectivity material is included internally within a housing of the system and located in the reachable region but outside the field of regard. The detector is configured to detect at least a portion of the emitted light scattered by the reference reflectivity material. The processor is configured to analyze detected information from the detector to determine an electrical property of the emitted light.

Abstract: A system comprises a light source, a scanner, a first detector, a second detector, and a processor. The light source is configured to emit light and the scanner is configured to scan the emitted light across at least a field of regard through a window. The first detector is configured to detect at least a portion of the emitted light scattered by a target located downrange from the system and the second detector is configured to detect at least a portion of the emitted light scattered by a close object located between the window and a minimum detection distance associated with the first detector. The processor is configured to analyze detected information from the second detector to provide an indication associated with detecting the close object.

Abstract: A system comprises a light source, a scanner, a first detector, a second detector, and a processor. The light source is configured to emit light and the scanner is configured to scan the emitted light across a field of view through a window. The first detector is configured to detect at least a portion of the emitted light scattered by a target located downrange from the system and the second detector is configured to detect at least a portion of the emitted light scattered by a blocking contaminant on the window. The processor is configured to analyze detected information from the second detector to provide an indication associated with detecting the blocking contaminant on the window.