Patents by Inventor Asher Calvin Leff

Asher Calvin Leff has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Strain mapping in TEM using precession electron diffraction
    Patent number: 9568442
    Abstract: A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanning. The data is then analyzed using local mis-orientation mapping and/or Nye's tensor analysis to provide information about local strain states.
    Type: Grant
    Filed: May 23, 2014
    Date of Patent: February 14, 2017
    Assignee: Drexel University
    Inventors: Mitra Lenore Taheri, Asher Calvin Leff