Patents by Inventor Asher Shor

Asher Shor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6331705
    Abstract: The invention provides a method for detecting gamma or X-ray radiation with a room temperature solid state detector, which comprises the selection of the detector's electron trapping parameter (&mgr;&tgr;)e and/or the detector voltage V so as to tune the electron trapping to optimally compensate for the incomplete charge collection.
    Type: Grant
    Filed: November 8, 1999
    Date of Patent: December 18, 2001
    Assignee: State of Israel, Atomic Energy Commission
    Inventors: Yosef Eisen, Asher Shor
  • Patent number: 6002741
    Abstract: A method and apparatus for obtaining the planar location with sub-pixel resolution and corrected energy of a gamma or X-ray photon interacting with a room temperature solid state detector of given thickness. The detector comprises two electrodes of negative and positive polarities. One of the electrodes is common, and the other is segmented being formed with segmented readout elements. Each of the readout elements defines a pixel size. Depending on that the negative or positive electrode is segmented, respectively, negative-induces charge signals are induced on the readout elements or both a positive-induced charge signal is induced on a central readout element and negative-induced charge signals are induced on adjacent readout elements.
    Type: Grant
    Filed: December 17, 1997
    Date of Patent: December 14, 1999
    Assignee: The State of Israel, Atomic Energy Commission Soreq Nuclear Research Center
    Inventors: Yosef Eisen, Asher Shor
  • Patent number: 5936249
    Abstract: A method and a system for obtaining spectroscopic data of a single photon of a given energy that undergoes an interaction, beginning at a given point in time, with a room-temperature solid state detector of a given thickness and fitted with two electrodes, which detection is held at a given bias by a voltage applied to the electrodes. In the course of the interaction, pairs of electrons and holes are created within the solid state detector which induce charge on the electrodes; the method and system enable for determination of a current induced by the electrons, being a measurable and quite accurate parameter for deducing spectroscopic data. The electron induced current is defined as the charge induced on the electrodes due to the electrons only, divided by the time it takes the electrons to induce this charge. The mentioned time is considered equal to that of a particular portion of a signal of the complete induced charge, and both the time and the charge are determined by the method and the system.
    Type: Grant
    Filed: October 16, 1997
    Date of Patent: August 10, 1999
    Assignee: State of Israel, Atomic Energy Commission Soreq Research Center
    Inventors: Yosef Eisen, Gideon Engler, Asher Shor, Eli Pollak