Abstract: Apparatuses, method, systems, and program products are disclosed for assessing instructor ratings on a defined rating scale for skewness. An apparatus includes a processor and a memory that stores code executable by the processor. The code, when executed by the processor, receives a raw instructor rating data set, comprising a plurality of ratings from an individual instructor, on a defined rating scale. The code is executable to determine a rating skewness of the raw instructor data set by subtracting a central tendency measure of the plurality of ratings from a central tendency measure of the defined rating scale, and dividing the result by the standard deviation of the plurality of ratings. The code is further executable to compare the rating skewness of the raw instructors rating data set to at least one comparative rating skewness to generate a skewness comparison report.

Abstract: A superluminescent light emitting diode (SLED) includes an active layer that includes a set of mixed strain quantum wells. The set of mixed strain quantum wells includes a set of compressive strained quantum wells and a set of tensile strained quantum wells. A potential difference applied across the SLED causes movement of electron carriers and hole carriers towards the active layer. Radiative recombination of electron and hole pairs in the set of compressive strained quantum wells enables emission of laterally polarized light and radiative recombination of electron and hole pairs in the set of tensile strained quantum wells enables emission of vertically polarized light. A combination of the laterally polarized light and vertically polarized light results in the emission of incoherent light from the SLED.