Abstract: A system and method for an automated analysis system for semiconductor manufacturing fabrication is disclosed. The system includes one or more site databases that each store data generated by an associated one or more semiconductor fabrication plants, a configuration database, and a server communicatively coupled to the one or more site databases and the configuration database, the server to analyze the data from the one or more site databases upon a request by a client, the data to be analyzed based on configuration settings in the configuration database that provide uniform configuration synchronization for applying algorithms to the data.

Abstract: In one embodiment, a system and method for an automated analysis system for semiconductor manufacturing fabrication is disclosed. In one embodiment, the system comprises one or more site databases that each store data generated by an associated one or more semiconductor fabrication plants, a configuration database, and a server communicatively coupled to the one or more site databases and the configuration database, the server to analyze the data from the one or more site databases upon a request by a client, the data to be analyzed based on configuration settings in the configuration database that provide uniform configuration synchronization for applying algorithms to the data. Other embodiments are also described.

Abstract: In a computing system having a repository program being executed by said system and a means for storing data, a method is disclosed for converting a UML model to a MOF model within the repository. This method includes the steps of selecting a package within the UML model, hereafter UML package, to be exported to the MOF model. Next, the UML package and its elements are exported to the MOF model. After this, relations are recursively set between MOF objects of the UML package that correspond to relations between UML objects in the package; and, MOF reference objects are created for navigable MOF association ends.