Abstract: During functional/normal operation of an integrated circuit including multiple independent processing elements (such as processors), a selected independent processing element is taken offline (e.g., by stopping functional operation of the independent processing element), and the functionality of the selected independent processing element is then tested while the remaining independent processing elements continue functional operation (e.g., standard application-specific operations). This enables the selected processing element to be robustly tested without stopping the regular operation of the integrated circuit.

Abstract: We describe a keystone correction system and method. A vertical scalar vertically scales an input image and stores the results to a line buffer. A horizontal scalar retrieves the stored results from the line buffer and horizontally scales the stored results using the relatively small number of lines from the line buffer. The system repeats the vertically scaling, storing, and horizontal scaling until it processes all input image lines.