Patents by Inventor Ashwin Ashok Wagadarikar

Ashwin Ashok Wagadarikar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8907290
    Abstract: A method for gain calibration of a gamma ray detector includes measuring signals generated by one or more light sensors of a gamma ray detector, generating one or more derived curves using the measured signals as a function of bias voltage and identifying a transition point in the one or more derived curves. The method also includes determining a breakdown voltage of the one or more light sensors using the identified transition point and setting a bias of the one or more light sensors based on the determined breakdown voltage.
    Type: Grant
    Filed: June 8, 2012
    Date of Patent: December 9, 2014
    Assignee: General Electric Company
    Inventors: Chang Lyong Kim, David Leo McDaniel, James Lindgren Malaney, William Todd Peterson, Vi-Hoa Tran, Ashwin Ashok Wagadarikar
  • Patent number: 8809793
    Abstract: Present embodiments relate to the calibration of detectors having one or more arrays of pixelated detectors. According to an embodiment, a method includes detecting optical outputs generated by a plurality of scintillation crystals of a detector with an array of pixelated detectors, generating, with the array of pixelated detectors, respective signals indicative of the optical outputs, generating, from the respective signals, a unique energy spectrum correlated to each of the plurality of scintillation crystals, grouping subsets of the plurality of scintillation crystals into macrocrystals, determining a representative energy spectrum peak for each macrocrystal based on the respective energy spectra of the scintillation crystals in the macrocrystal, comparing a value of the representative energy spectrum peak for each macrocrystal with a target peak value, and adjusting an operating parameter of at least one pixelated detector in the array of pixelated detectors as a result of the comparison.
    Type: Grant
    Filed: January 27, 2012
    Date of Patent: August 19, 2014
    Assignee: General Electric Company
    Inventors: Ashwin Ashok Wagadarikar, Ravindra Mohan Manjeshwar, Sergei Ivanovich Dolinsky
  • Publication number: 20130327932
    Abstract: Methods and systems for gain calibration of a gamma ray detector are provided. One method includes measuring signals generated by one or more light sensors of a gamma ray detector, generating one or more derived curves using the measured signals as a function of bias voltage and identifying a transition point in the one or more derived curves. The method also includes determining a breakdown voltage of the one or more light sensors using the identified transition point and setting a bias of the one or more light sensors based on the determined breakdown voltage.
    Type: Application
    Filed: June 8, 2012
    Publication date: December 12, 2013
    Applicant: General Electric Company
    Inventors: Chang Lyong Kim, David Leo McDaniel, James Lindgren Malaney, William Todd Peterson, Vi-Hoa Tran, Ashwin Ashok Wagadarikar
  • Publication number: 20130193330
    Abstract: Present embodiments relate to the calibration of detectors having one or more arrays of pixelated detectors. According to an embodiment, a method includes detecting optical outputs generated by a plurality of scintillation crystals of a detector with an array of pixelated detectors, generating, with the array of pixelated detectors, respective signals indicative of the optical outputs, generating, from the respective signals, a unique energy spectrum correlated to each of the plurality of scintillation crystals, grouping subsets of the plurality of scintillation crystals into macrocrystals, determining a representative energy spectrum peak for each macrocrystal based on the respective energy spectra of the scintillation crystals in the macrocrystal, comparing a value of the representative energy spectrum peak for each macrocrystal with a target peak value, and adjusting an operating parameter of at least one pixelated detector in the array of pixelated detectors as a result of the comparison.
    Type: Application
    Filed: January 27, 2012
    Publication date: August 1, 2013
    Applicant: General Electric Company
    Inventors: Ashwin Ashok Wagadarikar, Ravindra Mohan Manjeshwar, Sergei Ivanovich Dolinsky