Abstract: A method of determining brain stimulation parameters includes applying Low Frequency Stimulation (LFS) to a contact of a multi-contact electrode implanted in a target structure in an individual's brain. Evoked Compound Activity (ECA) evoked in the target structure by the LFS is measured. A range of frequencies for delivering brain stimulation within a predetermined range based on a phase space extracted from the ECA is determined. Stimulation frequencies are applied to the contact of the multi-contact electrode within the determined range of frequencies. High Frequency Oscillations (HFO) evoked in the target structure by the applied stimulation frequencies within the determined range are measured. A frequency evoking HFO above a predetermined threshold is determined. The determined frequency is selected as a treatment frequency for the target structure.

Abstract: A method of locating an implantation site in the brain includes inserting a plurality of multi-contact electrodes into a region of a target structure in an individual's brain. High Frequency Stimulation (HFS) is applied to a contact of a multi-contact electrode of the plurality of multi-contact electrodes. High Frequency Oscillations (HFO) evoked in the region of the target structure by the HFS are measured. Evoked Compound Activity (ECA) evoked in the region of the target structure by the HFS is measured. It is determined if at least one of the HFO and the ECA is above a predetermined threshold. If at least one of the HFO and the ECA is above the predetermined threshold, a location of the contact of the multi-contact electrode is identified as a site for electrode implantation in the individual's brain.

Abstract: A method of locating an implantation site in the brain includes inserting a plurality of multi-contact electrodes into a region of a target structure in an individual's brain. High Frequency Stimulation (HFS) is applied to a contact of a multi-contact electrode of the plurality of multi-contact electrodes. High Frequency Oscillations (HFO) evoked in the region of the target structure by the HFS are measured. Evoked Compound Activity (ECA) evoked in the region of the target structure by the HFS is measured. It is determined if at least one of the HFO and the ECA is above a predetermined threshold. If at least one of the HFO and the ECA is above the predetermined threshold, a location of the contact of the multi-contact electrode is identified as a site for electrode implantation in the individual's brain.

Abstract: A method of determining brain stimulation parameters includes applying Low Frequency Stimulation (LFS) to a contact of a multi-contact electrode implanted in a target structure in an individual's brain. Evoked Compound Activity (ECA) evoked in the target structure by the LFS is measured. A range of frequencies for delivering brain stimulation within a predetermined range based on a phase space extracted from the ECA is determined. Stimulation frequencies are applied to the contact of the multi-contact electrode within the determined range of frequencies. High Frequency Oscillations (HFO) evoked in the target structure by the applied stimulation frequencies within the determined range are measured. A frequency evoking HFO above a predetermined threshold is determined. The determined frequency is selected as a treatment frequency for the target structure.