Abstract: A vehicular autonomous driving system includes a fault prediction unit, including a processor and memory, configured to predict a potential future fault condition by: monitoring performance data associated with the plurality of autonomous driving components; comparing the performance data associated with the plurality of autonomous driving components to a plurality of performance thresholds; and determining the potential future fault condition for one of the plurality of autonomous driving components, when the performance data associated with the one of the plurality of autonomous driving components compare unfavorably to corresponding one of the plurality of performance thresholds.

Abstract: A vehicular autonomous driving system includes a fault prediction unit, including a processor and memory, configured to predict a potential future fault condition by: monitoring performance data associated with the plurality of autonomous driving components; comparing the performance data associated with the plurality of autonomous driving components to a plurality of performance thresholds; and determining the potential future fault condition for one of the plurality of autonomous driving components, when the performance data associated with the one of the plurality of autonomous driving components compares unfavorably to a corresponding one of the plurality of performance thresholds.

Abstract: A vehicular autonomous driving system includes a fault prediction unit, including a processor and memory, configured to predict a potential future fault condition by: monitoring performance data associated with the plurality of autonomous driving components; comparing the performance data associated with the plurality of autonomous driving components to a plurality of performance thresholds; and determining the potential future fault condition for one of the plurality of autonomous driving components, when the performance data associated with the one of the plurality of autonomous driving components compares unfavorably to a corresponding one of the plurality of performance thresholds.

Abstract: A capture clock generation control mechanism is provided. The capture clock generation control mechanism controls the number of at-speed clocks generated and supplied to one or more scan chains during scan testing of a microcircuit based on control data stored in a JTAG or scan test register. The scan test register may be formed out of scan cells and comprise part of a scan chain. Automatic Test Pattern Generation (ATPG) tools may generate the data that is loaded into the scan test register to automatically configure the clock generation control mechanism. The clock control mechanism may include the ability to adjust the position of the at-speed clocks within a capture cycle, thereby facilitating transition fault detection.

Abstract: A capture clock generation control mechanism is provided. The capture clock generation control mechanism controls the number of at-speed clocks generated and supplied to one or more scan chains during scan testing of a microcircuit based on control data stored in a JTAG or scan test register. The scan test register may be formed out of scan cells and comprise part of a scan chain. Automatic Test Pattern Generation (ATPG) tools may generate the data that is loaded into the scan test register to automatically configure the clock generation control mechanism. The clock control mechanism may include the ability to adjust the position of the at-speed clocks within a capture cycle, thereby facilitating transition fault detection.

Abstract: An integrated circuit (1600) includes a debug module (1602) and a clock generator (1610). The debug module (1602) is configured to receive a test pattern and provide a mode signal based on the test pattern. The clock generator (1610) includes a first clock input configured to receive a first clock signal, a second clock input configured to receive a second clock signal, and a mode input configured to receive the mode signal. The first and second clock signals are out of phase and have the same clock frequency. The clock generator (1610) is configured to provide a generated clock signal whose effective frequency is based on the first and second clock signals and the mode signal.

Abstract: An integrated circuit (1600) includes a debug module (1602) and a clock generator (1610). The debug module (1602) is configured to receive a test pattern and provide a mode signal based on the test pattern. The clock generator (1610) includes a first clock input configured to receive a first clock signal, a second clock input configured to receive a second clock signal, and a mode input configured to receive the mode signal. The first and second clock signals are out of phase and have the same clock frequency. The clock generator (1610) is configured to provide a generated clock signal whose effective frequency is based on the first and second clock signals and the mode signal.