Patents by Inventor Athar SEFID

Athar SEFID has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11409642
    Abstract: A method for parameter value resolution, includes extracting, from an application programming interface (API) repository, metadata information associated with an API parameter set of at least one API and generating parameter clusters associated with the API parameter set based on the extracted metadata information. Each parameter cluster may include word tokens associated with at least one API parameter of the API parameters set. The method furthers includes determining a representative term for each parameter cluster and based on the determined representative term, extracting sample parameter values from a knowledge base server. The method further includes generating test API endpoints associated with the at least one API based on the extracted sample parameter values, validating the extracted sample parameter values by executing the generated test API endpoints, and publishing, based on the validation, validation result as an indicator for suitability of the at least one API for a software application.
    Type: Grant
    Filed: January 13, 2020
    Date of Patent: August 9, 2022
    Assignee: FUJITSU LIMITED
    Inventors: Junhee Park, Athar Sefid, Wei-Peng Chen
  • Publication number: 20210216443
    Abstract: A method for parameter value resolution, includes extracting, from an application programming interface (API) repository, metadata information associated with an API parameter set of at least one API and generating parameter clusters associated with the API parameter set based on the extracted metadata information. Each parameter cluster may include word tokens associated with at least one API parameter of the API parameters set. The method furthers includes determining a representative term for each parameter cluster and based on the determined representative term, extracting sample parameter values from a knowledge base server. The method further includes generating test API endpoints associated with the at least one API based on the extracted sample parameter values, validating the extracted sample parameter values by executing the generated test API endpoints, and publishing, based on the validation, validation result as an indicator for suitability of the at least one API for a software application.
    Type: Application
    Filed: January 13, 2020
    Publication date: July 15, 2021
    Applicant: FUJITSU LIMITED
    Inventors: Junhee PARK, Athar SEFID, Wei-Peng CHEN