Patents by Inventor Atsushi Dohi

Atsushi Dohi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6757062
    Abstract: According to a method of measuring a thickness, to measure a thickness d of a liquid crystal layer 11, a property of reflected light is utilized, in that the light returns maintaining the same polarizing plane as that of an entrance when a polarizing plane-maintaining condition is satisfied in which a difference in optical path lengths between an ordinary ray and an extraordinary ray of the reflected light is a sum of an integer multiple of the wavelength and a half-wavelength or an integer multiple, to find a wavelength at which the polarizing plane-maintaining condition is satisfied. A reasonable &Dgr;n·d is thereby found. This is performed for a plurality of wavelengths to find a relational expression of a wavelength and &Dgr;n·d. A known combination of a wavelength &lgr; and &Dgr;n is assigned to the relational expression to find d.
    Type: Grant
    Filed: January 29, 2001
    Date of Patent: June 29, 2004
    Assignee: Sharp Kabushiki Kaisha
    Inventor: Atsushi Dohi
  • Patent number: 6429920
    Abstract: An object of the invention is to obtain achromatic display with high contrast and high lightness. A reflection type liquid crystal display device of NB mode comprises a liquid crystal cell having an STN type liquid crystal layer; a first phase difference plate; a second phase difference plate; a polarizing plate, the first and second phase difference plates and polarizing plate being disposed on one surface of the liquid crystal cell in this order; and a reflecting layer disposed in the liquid crystal cell, the reflecting layer forming the other surface of the liquid crystal cell. The liquid crystal layer retardation &Dgr;nLC.dLC, the first phase difference plate retardation &Dgr;n1.d1 and the second phase difference plate retardation &Dgr;n2.d2 are selected from the ranges of 660 nm to 830 nm, 120 nm to 240 nm and 300 nm to 430 nm, respectively. A twist angle &khgr; is selected from the range of 220° to 260°.
    Type: Grant
    Filed: June 2, 2000
    Date of Patent: August 6, 2002
    Assignee: Sharp Kabushiki Kaisha
    Inventor: Atsushi Dohi
  • Publication number: 20010050771
    Abstract: According to a method of measuring a thickness, to measure a thickness d of a liquid crystal layer 11, a property of reflected light is utilized, in that the light returns maintaining the same polarizing plane as that of an entrance when a polarizing plane-maintaining condition is satisfied in which a difference in optical path lengths between an ordinary ray and an extraordinary ray of the reflected light is a sum of an integer multiple of the wavelength and a half-wavelength or an integer multiple, to find a wavelength at which the polarizing plane-maintaining condition is satisfied. A reasonable &Dgr;n·d is thereby found. This is performed for a plurality of wavelengths to find a relational expression of a wavelength and &Dgr;n·d. A known combination of a wavelength &lgr; and &Dgr;n is assigned to the relational expression to find d.
    Type: Application
    Filed: January 29, 2001
    Publication date: December 13, 2001
    Inventor: Atsushi Dohi