Patents by Inventor Atsushi Kida

Atsushi Kida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6363165
    Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: March 26, 2002
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Masato Hara, Masayuki Sugiura, Atsushi Kida
  • Patent number: 6351554
    Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: February 26, 2002
    Assignee: Asahi Kugaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Masato Hara, Masayuki Sugiura, Atsushi Kida
  • Patent number: 6349145
    Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: February 19, 2002
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Masato Hara, Masayuki Sugiura, Atsushi Kida
  • Patent number: 6339683
    Abstract: A standard scale used in a photogrammetric measurement system has a polygonal plate having three apexes which are arranged to define a reference plane, where each of the apexes defines a reference point. Another standard scale has a light-guide plate member which has three light-emitting spots for defining reference points. Yet another standard scale has a frame member, and reference-point-forming elements, for defining reference points, arranged on the frame to define a reference plane. A marker used in a photogrammetric measurement system for defining a standard scale has a light-guide plate having a light emitting spot for defining a reference point. Another marker has a polygonal-pyramidal-shaped optical assembly formed from light-guide plates, including a core layer containing fluorescent substances, such that an apex of the optical assembly is defined by an emission of fluorescent radiation therefrom.
    Type: Grant
    Filed: June 27, 2000
    Date of Patent: January 15, 2002
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Atsushi Kida, Atsumi Kaneko
  • Patent number: 6314200
    Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: November 6, 2001
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Masato Hara, Masayuki Sugiura, Atsushi Kida
  • Patent number: 6304669
    Abstract: A photogrammetric measurement system produces a survey map based on a set of photographed pictures obtained at two different photographing positions. Each of the pictures includes at least one continuous line and at least three conspicuous points away from the continuous line, with at least one of the conspicuous points and remaining conspicuous points being placed at opposing sides of the continuous line. The set of pictures are produced as a first picture and a second picture. First lines are produced between the conspicuous points on the first picture such that the lines intersect the continuous line, thereby generating intersecting points. Second lines are produced between the conspicuous points on the second picture such that the lines intersect the continuous line, thereby generating further intersecting points.
    Type: Grant
    Filed: November 9, 1998
    Date of Patent: October 16, 2001
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Atsumi Kaneko, Masato Hara, Toshihiro Nakayama, Atsushi Kida, Shigeru Wakashiro
  • Patent number: 6148097
    Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.
    Type: Grant
    Filed: June 5, 1996
    Date of Patent: November 14, 2000
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Masato Hara, Masayuki Sugiura, Atsushi Kida
  • Patent number: 6144761
    Abstract: In a photogrammetric analytical measurement system, a survey map is produced on the basis of two respective photographed pictures obtained at two different photographing positions. Each of the pictures includes an object image to be recorded on the survey map, and a standard measurement scale image for producing an accurately scaled object image. Data for producing the survey map is approximately calculated on the basis of two-dimensional position data inputted to the computer by designating the scale image and the object image on the pictures with a cursor, by an operator's manipulation of a mouse. When the results of the approximate calculations are erroneous, it is indicated that the inputting of the two-dimensional position data, by designation of the object image with the cursor, should be repeated.
    Type: Grant
    Filed: February 2, 1998
    Date of Patent: November 7, 2000
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Atsumi Kaneko, Atsushi Kida, Toshihiro Nakayama
  • Patent number: 6108497
    Abstract: A standard scale used in a photogrammetric measurement system has a polygonal plate having three apexes which are arranged to define a reference plane, where each of the apexes defines a reference point. Another standard scale has a light-guide plate member which has three light-emitting spots for defining reference points. Yet another standard scale has a frame member, and reference-point-forming elements, for defining reference points, arranged on the frame to define a reference plane. A marker used in a photogrammetric measurement system for defining a standard scale has a light-guide plate having a light emitting spot for defining a reference point. Another marker has a polygonal-pyramidal-shaped optical assembly formed from light-guide plates, including a core layer containing fluorescent substances, such that an apex of the optical assembly is defined by an emission of fluorescent radiation therefrom.
    Type: Grant
    Filed: November 5, 1997
    Date of Patent: August 22, 2000
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Toshihiro Nakayama, Atsushi Kida, Atsumi Kaneko
  • Patent number: 5995765
    Abstract: A camera is used in a photogrammetric analytical measurement, and has a distance-measuring sensor unit for measuring a vertical distance between the camera and a sloping surface of the ground and a minimum distance between the camera and the sloping surface of the ground when the camera is placed above the sloping surface of the ground. The camera has a memory medium for storing the vertical distance and the minimum distance as vertical distance data and minimum distance data, respectively.
    Type: Grant
    Filed: January 6, 1998
    Date of Patent: November 30, 1999
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Atsumi Kaneko, Toshihiro Nakayama, Atsushi Kida
  • Patent number: 5847822
    Abstract: An optical element inspecting apparatus for detecting an optical defect of an optical element to be inspected. The inspection apparatus includes a diffusion plate, a device for emitting light towards the diffusion plate such that a diffused light diffused by the diffusion plate is incident upon an optical system including at least the optical element, and a device for intercepting a part of the diffused light so that the part of the diffused light is not incident upon the optical system. The light intercepting device is positioned substantially in a plane perpendicular to an optical axis of the optical system, between the optical system and the diffusion plate, substantially at a focal point of the optical system.
    Type: Grant
    Filed: August 23, 1996
    Date of Patent: December 8, 1998
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Masayuki Sugiura, Masato Hara, Toshihiro Nakayama, Atsushi Kida
  • Patent number: 5835207
    Abstract: An optical member inspecting apparatus comprises an illuminating unit for illuminating a target lens to be inspected and a photographing unit to detect the light transmitted through the target lens. The illumination unit has a circular diffuser plate on which a semi-circular light intercepting plate is attached. The diffuser plate can rotate about a rotation axis. The target lens is supported by an X-Y stage that moves the target lens in a plane perpendicular to the rotation axis. An image processing unit detects brightness distributions at different rotational positions of the light intercepting plate to calculate a brightness difference which represents a deviation of the optical axis of the target lens from the rotation axis. The image processing unit controls the X-Y stage based on the brightness difference so as to correct the deviation.
    Type: Grant
    Filed: September 19, 1996
    Date of Patent: November 10, 1998
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Masayuki Sugiura, Masato Hara, Toshihiro Nakayama, Atsushi Kida
  • Patent number: 5828500
    Abstract: An optical element inspecting apparatus for inspecting optical elements for defects. The optical element inspecting apparatus includes an illuminating unit, an image capturing unit, two polarizers, a rotation device, a controller, and a means for composing a plurality of image data captured by the image capturing unit.The optical element to be inspected is placed between the polarizers and is illuminated by the illuminating unit. The light that passes through the polarizers and the optical element is captured by the image capturing unit and stored in memory. The controller controls the rotation device such that the polarizers are rotated by a predetermined amount and a subsequent image data is captured. In this way, a number of image data are captured and all image data are composed to make a composite image data. The optical element is examined to detect flaws therein by using the composite image data.
    Type: Grant
    Filed: October 9, 1996
    Date of Patent: October 27, 1998
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Atsushi Kida, Masato Hara, Masayuki Sugiura, Toshihiro Nakayama