Patents by Inventor Atsushi Maniwa

Atsushi Maniwa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230216022
    Abstract: A composite active material for a lithium secondary battery includes a matrix having a plurality of voids and a Si-based material accommodated in the voids. The matrix includes amorphous carbon. The Si-based material is Si or a Si alloy.
    Type: Application
    Filed: March 23, 2021
    Publication date: July 6, 2023
    Applicant: TOSOH CORPORATION
    Inventors: Toshiki IWASHIMA, Taichi ARAKAWA, Yuto ISHIZUKA, Masanori ABE, Hidehiko MISAKI, Atsushi MANIWA
  • Patent number: 9349601
    Abstract: The present invention is to provide a ruthenium complex represented by formula (1a), (2), (3), etc., which is useful for producing a ruthenium-containing thin film both under the conditions using an oxidizing gas as the reaction gas and under the conditions using a reducing gas as the reaction gas: wherein R1a to R7a, R8, R9 and R10 to R18 represents an alkyl group having a carbon number of 1 to 6, etc., and n represents an integer of 0 to 2.
    Type: Grant
    Filed: December 6, 2013
    Date of Patent: May 24, 2016
    Assignees: TOSOH CORPORATION, SAGAMI CHEMICAL RESEARCH INSTITUTE
    Inventors: Kenichi Tada, Toshiki Yamamoto, Hiroyuki Oike, Atsushi Maniwa, Hirokazu Chiba, Kohei Iwanaga, Kazuhisa Kawano
  • Publication number: 20150303063
    Abstract: The present invention is to provide a ruthenium complex represented by formula (1a), (2), (3), etc., which is useful for producing a ruthenium-containing thin film both under the conditions using an oxidizing gas as the reaction gas and under the conditions using a reducing gas as the reaction gas: wherein R1a to R7a, R8, R9 and R10 to R18 represents an alkyl group having a carbon number of 1 to 6, etc., and n represents an integer of 0 to 2.
    Type: Application
    Filed: December 6, 2013
    Publication date: October 22, 2015
    Inventors: Kenichi TADA, Toshiki YAMAMOTO, Hiroyuki OIKE, Atsushi MANIWA, Hirokazu CHIBA, Kohei IWANAGA, Kazuhisa KAWANO
  • Patent number: 9120825
    Abstract: This invention aims at providing a material from which a silicon-containing thin film can be efficiently produced at a low temperature of 500° C. or less without using plasma or the like. The invention relates to produce a hydrosilane derivative represented by the general formula (1?) by reacting a chlorosilane derivative (3) with a compound M2Z (4) and produce the silicon-containing thin film by using the hydrosilane derivative as the material. In the formulae, R1, R2 are defined in the specification.
    Type: Grant
    Filed: May 30, 2011
    Date of Patent: September 1, 2015
    Assignees: TOSOH CORPORATION, SAGAMI CHEMICAL RESEARCH INSTITUTE
    Inventors: Ken-ichi Tada, Kohei Iwanaga, Toshiki Yamamoto, Atsushi Maniwa
  • Patent number: 8779174
    Abstract: A subject for the invention is to provide novel titanium complexes which have a high vapor pressure and high thermal stability and serve as an excellent material for producing a titanium-containing thin film by a technique such as the CVD method or ALD method and to further provide processes for producing these complexes, titanium-containing thin films produced from the complexes, and a process for producing the thin films. The invention relates to producing a titanium complex represented by general formula (1): (wherein R1 and R4 each independently represent an alkyl group having 1-16 carbon atoms; R2 and R3 each independently represent a hydrogen atom or an alkyl group having 1-3 carbon atoms; and R5 represents an alkyl group which has 1-16 carbon atoms and may have been substituted with one or more fluorine atoms) and to producing a titanium-containing thin film using the complex.
    Type: Grant
    Filed: June 12, 2009
    Date of Patent: July 15, 2014
    Assignees: Tosoh Corporation, Sagami Chemical Research Institute
    Inventors: Ken-ichi Tada, Toshiki Yamamoto, Hirokazu Chiba, Kohei Iwanaga, Atsushi Maniwa, Tadahiro Yotsuya, Noriaki Oshima
  • Patent number: 8742153
    Abstract: For forming a thin ruthenium film of good quality by CVD method, it is necessary to form the thin film at low temperature. There hence is a desire for a ruthenium compound having a high reactivity to heat. This invention relates to a method of producing a ruthenium-containing film by CVD or the like using, as a raw material, a ruthenium complex mixture containing (2,4-dimethylpentadienyl)(ethyl-cyclopentadienyl)ruthenium and bis(2,4-dimethylpentadienyl)ruthenium, the amount of the latter compound being 0.1 to 100% by weight based on the weight of (2,4-dimethylpentadienyl)(ethylcyclopentadienyl)ruthenium, and the like.
    Type: Grant
    Filed: November 29, 2010
    Date of Patent: June 3, 2014
    Assignee: Tosoh Corporation
    Inventors: Atsushi Maniwa, Noriaki Oshima, Kazuhisa Kawano, Taishi Furukawa, Hirokazu Chiba, Toshiki Yamamoto
  • Publication number: 20130123528
    Abstract: This invention aims at providing a material from which a silicon-containing thin film can be efficiently produced at a low temperature of 500° C. or less without using plasma or the like. The invention relates to produce a hydrosilane derivative represented by the general formula (1?) by reacting a chlorosilane derivative (3) with a compound M2Z (4) and produce the silicon-containing thin film by using the hydrosilane derivative as the material. In the formulae, R1, R2 are defined in the specification.
    Type: Application
    Filed: May 30, 2011
    Publication date: May 16, 2013
    Applicants: SAGAMI CHEMICAL RESEARCH INSTITUTE, TOSOH CORPORATION
    Inventors: Ken-ichi Tada, Kohei Iwanaga, Toshiki Yamamoto, Atsushi Maniwa
  • Publication number: 20120227625
    Abstract: For forming a thin ruthenium film of good quality by CVD method, it is necessary to form the thin film at low temperature. There hence is a desire for a ruthenium compound having a high reactivity to heat. This invention relates to a method of producing a ruthenium-containing film by CVD or the like using, as a raw material, a ruthenium complex mixture containing (2,4-dimethylpentadienyl)(ethyl-cyclopentadienyl)ruthenium and bis(2,4-dimethylpentadienyl)ruthenium, the amount of the latter compound being 0.1 to 100% by weight based on the weight of (2,4-dimethylpentadienyl)(ethylcyclopentadienyl)ruthenium, and the like.
    Type: Application
    Filed: November 29, 2010
    Publication date: September 13, 2012
    Inventors: Atsushi Maniwa, Noriaki Oshima, Kazuhisa Kawano, Taishi Furukawa, Hirokazu Chiba, Toshiki Yamamoto
  • Publication number: 20120029220
    Abstract: A subject for the invention is to provide novel titanium complexes which have a high vapor pressure and high thermal stability and serve as an excellent material for producing a titanium-containing thin film by a technique such as the CVD method or ALD method and to further provide processes for producing these complexes, titanium-containing thin films produced from the complexes, and a process for producing the thin films. The invention relates to producing a titanium complex represented by general formula (1): (wherein R1 and R4 each independently represent an alkyl group having 1-16 carbon atoms; R2 and R3 each independently represent a hydrogen atom or an alkyl group having 1-3 carbon atoms; and R5 represents an alkyl group which has 1-16 carbon atoms and may have been substituted with one or more fluorine atoms) and to producing a titanium-containing thin film using the complex.
    Type: Application
    Filed: June 12, 2009
    Publication date: February 2, 2012
    Applicants: SAGAMI CHEMICAL RESEARCH INSTITUTE, TOSOH CORPORATION
    Inventors: Ken-ichi Tada, Toshiki Yamamoto, Hirokazu Chiba, Kohei Iwanaga, Atsushi Maniwa, Tadahiro Yotsuya, Noriaki Oshima