Patents by Inventor Atsushi Shishido

Atsushi Shishido has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Deformation testing apparatus
    Patent number: 11326993
    Abstract: Provide is a deformation testing apparatus in which a sign of breakage of a specimen under a deformation test can be detected before an actual breakage. The deformation testing apparatus carrying out a plurality of deformation cycles includes an image capturing means; reference data storing means storing the reference data showing the deformation state calculated based on the reference image data shot by the image capturing means; reference cycle number deformation data calculating means to calculate the reference data; detection cycle number deformation data calculating means to calculate detection cycle number deformation data showing the deformation state based on the detection image data shot at the detection cycle number being larger than the reference cycle number; and change detection means to detect that the deformation caused in the specimen is changed based on the reference cycle number deformation data and the detection cycle number deformation data.
    Type: Grant
    Filed: January 6, 2020
    Date of Patent: May 10, 2022
    Assignee: Yuasa System Co., LTD.
    Inventors: Atsushi Shishido, Norihisa Akamatsu, Ryo Taguchi, Yoshihito Ota, Hisao Sasaki, Yasuhisa Okazaki
  • DEFORMATION TESTING APPARATUS
    Publication number: 20210215586
    Abstract: Provide is a deformation testing apparatus in which a sign of breakage of a specimen under a deformation test can be detected before an actual breakage. The deformation testing apparatus carrying out a plurality of deformation cycles includes an image capturing means; reference data storing means storing the reference data showing the deformation state calculated based on the reference image data shot by the image capturing means; reference cycle number deformation data calculating means to calculate the reference data; detection cycle number deformation data calculating means to calculate detection cycle number deformation data showing the deformation state based on the detection image data shot at the detection cycle number being larger than the reference cycle number; and change detection means to detect that the deformation caused in the specimen is changed based on the reference cycle number deformation data and the detection cycle number deformation data.
    Type: Application
    Filed: January 6, 2020
    Publication date: July 15, 2021
    Applicants: YUASA SYSTEM CO., LTD., Tokyo Institute of Technology
    Inventors: Atsushi SHISHIDO, Norihisa AKAMATSU, Ryo TAGUCHI, Yoshihito OTA, Hisao SASAKI, Yasuhisa OKAZAKI
  • Photo-alignment material and photo-alignment method
    Patent number: 10788715
    Abstract: A photo-alignment material in which an alignment film can be formed parallel to a vibration direction of light and a tilt angle of the alignment film is easily controlled and a photo-alignment method using the photo-alignment material are provided. A photo-alignment material of the present invention contains a photo-responsive substance having a threshold value of responding light intensity.
    Type: Grant
    Filed: November 20, 2018
    Date of Patent: September 29, 2020
    Assignees: TOKYO INSTITUTE OF TECHNOLOGY, DIC CORPORATION
    Inventors: Motoi Kinoshita, Atsushi Shishido, Isa Nishiyama
  • PHOTO-ALIGNMENT MATERIAL AND PHOTO-ALIGNMENT METHOD
    Publication number: 20190086738
    Abstract: A photo-alignment material in which an alignment film can be formed parallel to a vibration direction of light and a tilt angle of the alignment film is easily controlled and a photo-alignment method using the photo-alignment material are provided. A photo-alignment material of the present invention contains a photo-responsive substance having a threshold value of responding light intensity.
    Type: Application
    Filed: November 20, 2018
    Publication date: March 21, 2019
    Applicants: TOKYO INSTITUTE OF TECHNOLOGY, DIC CORPORATION
    Inventors: Motoi Kinoshita, Atsushi Shishido, Isa Nishiyama
  • PHOTO-ALIGNMENT MATERIAL AND PHOTO-ALIGNMENT METHOD
    Publication number: 20160202560
    Abstract: A photo-alignment material in which an alignment film can be formed parallel to a vibration direction of light and a tilt angle of the alignment film is easily controlled and a photo-alignment method using the photo-alignment material are provided. A photo-alignment material of the present invention contains a photo-responsive substance having a threshold value of responding light intensity.
    Type: Application
    Filed: August 6, 2014
    Publication date: July 14, 2016
    Applicants: TOKYO INSTITUTE OF TECHNOLOGY, DIC CORPORATION
    Inventors: Motoi Kinoshita, Atsushi Shishido, Isa Nishiyama