Abstract: Provided is a semiconductor device including: a semiconductor substrate; an active portion provided on the semiconductor substrate; a first well region and a second well region arranged sandwiching the active portion in a top view, provided on the semiconductor substrate; an emitter electrode arranged above the active portion; and a pad arranged above the first well region, away from the emitter electrode, wherein the emitter electrode is provided above the second well region. The provided semiconductor device further includes a peripheral well region arranged enclosing the active portion in a top view, wherein the first well region and the second well region may protrude to the center side of the active portion rather than the peripheral well region.

Abstract: A coil device includes a coil, a terminal, a bobbin, and a core. The coil includes a winding portion and a lead portion drawn out from the winding portion. The terminal is connected with the lead portion. The bobbin includes a cylinder portion for the winding portion and a terminal installation portion formed at an end in a first direction parallel to an axial direction of the cylinder portion and provided with the terminal. The core is attachable to the bobbin. The terminal installation portion includes a convex portion separating the core and the terminal.

Abstract: Provided is a semiconductor device including: a semiconductor substrate; an active portion provided on the semiconductor substrate; a first well region and a second well region arranged sandwiching the active portion in a top view, provided on the semiconductor substrate; an emitter electrode arranged above the active portion; and a pad arranged above the first well region, away from the emitter electrode, wherein the emitter electrode is provided above the second well region. The provided semiconductor device further includes a peripheral well region arranged enclosing the active portion in a top view, wherein the first well region and the second well region may protrude to the center side of the active portion rather than the peripheral well region.

Abstract: A management system includes: a detection device including a main body that has a shape installable to a discharge port, electrodes that are provided in the main body and are detectors detecting a liquid, and a communication device that functions as a transmitter transmitting information regarding a detection result obtained by the detector; and an estimation device including a receiver that receives the information transmitted from the transmitter, and an estimator that estimates a discharge state of the liquid from the discharge port based on the information received by the receiver.

Abstract: Provided is a testing method for testing a semiconductor device provided with a main element portion including a main transistor portion and a main diode portion, and a sensing transistor portion for current detection, the testing method having: operating an element by causing a diode operation of the sensing transistor portion in the semiconductor device in a chip or wafer state; measuring the element by measuring a voltage-current characteristic showing a relationship between a voltage between main terminals of the sensing transistor portion and a current flowing through the main terminals during the diode operation; and determining the element by determining a defectiveness of the semiconductor device based on the voltage-current characteristic.

Abstract: Provided is a fabrication method of a semiconductor device comprising an element forming process of forming a semiconductor element in a semiconductor substrate and forming a metal electrode above the semiconductor substrate; a plating process of plating the metal electrode; an annealing process of annealing the semiconductor substrate; a voltage applying process of applying a voltage corresponding to a thickness of the gate insulating film to the gate insulating film after the annealing process; and a judging process of measuring a threshold voltage of the semiconductor element after the voltage applying process, and judging a quality of the semiconductor element based on a measurement result.

Abstract: A composite coil device includes a winding shaft portion, a first conductor portion, and a second conductor portion. The winding shaft portion at least partly includes a magnetic body and axially includes a first section and a second section. The first conductor portion is wound continuously in the first section and the second section. The second conductor portion is wound in the second section.

Abstract: Provided is a semiconductor device including: a semiconductor substrate; an active portion provided on the semiconductor substrate; a first well region and a second well region arranged sandwiching the active portion in a top view, provided on the semiconductor substrate; an emitter electrode arranged above the active portion; and a pad arranged above the first well region, away from the emitter electrode, wherein the emitter electrode is provided above the second well region. The provided semiconductor device further includes a peripheral well region arranged enclosing the active portion in a top view, wherein the first well region and the second well region may protrude to the center side of the active portion rather than the peripheral well region.

Abstract: A technique for efficiently performing operations for identifying a current position in a method of measuring electromagnetic waves is provided. A measuring device includes a measurement planned position data receiving unit 302, a current position data receiving unit 303, and a GUI controlling unit 306. The measurement planned position data receiving unit 302 receives data of measurement planned positions at each of which electromagnetic waves are measured. The current position data receiving unit 303 receives data of a current position of an electromagnetic wave measuring device. The GUI controlling unit 306 controls displaying of a relationship between the current position of the electromagnetic wave measuring device and the measurement planned position on a display based on data of the measurement planned positions and data of the current position.

Abstract: A technique for more smoothly moving a reflective prism to a target position is provided. A surveying instrument 100 includes a leg part 101, a base 102 supported by the leg part 101, a movable part 112 held by the base 102 and being movable straight in any direction within a two-dimensional plane relative to the base 102, a reflective prism 113 mounted on the movable part 112, and a laser pointer 114 that is mounted to the movable part 112 and that emits a guiding light in a vertical direction.

Abstract: A technique for efficiently performing operations for identifying a current position in a method of measuring electromagnetic waves is provided. A measuring device includes a measurement planned position data receiving unit 302, a current position data receiving unit 303, and a GUI controlling unit 306. The measurement planned position data receiving unit 302 receives data of measurement planned positions at each of which electromagnetic waves are measured. The current position data receiving unit 303 receives data of a current position of an electromagnetic wave measuring device. The GUI controlling unit 306 controls displaying of a relationship between the current position of the electromagnetic wave measuring device and the measurement planned position on a display based on data of the measurement planned positions and data of the current position.

Abstract: An example film forming device is provided with: a chamber for forming a film on a substrate; a supply tube for supplying a cleaning gas to the chamber; and a plasma generating unit, which is provided to the supply tube, and which generates plasma from the cleaning gas. The film forming device is characterized by being provided with: a temperature control unit that controls the temperature of the supply tube to temperature equal to or higher than a predetermined temperature; and a supply unit which supplies, each time when a previously set time equal to or shorter than 36 hours elapses, the chamber with the plasma thus generated by the plasma generating unit.

Abstract: A technique for identifying a measurement planned position for electromagnetic waves in a three-dimensional space in a simple and easy manner is provided. A position of a measuring unit 200 that is carried by an operator 100 is measured by a position measuring device that is configured to measure a position by laser light. A positional relationship between the measured position and the position of a measurement planned position 601 is displayed on a terminal 300 that is carried by the operator 100. This display guides the operator 100, and the operator 100 identifies the measurement planned position 601 and measure illuminance thereat.

Abstract: An image forming apparatus obtains a number of pixels to be developed on a downstream side in a sub-scanning direction from each one of the predetermined pixels, in order to correct a density increase that occurs at the trailing edge of an image to be formed in accordance with a peripheral speed difference between a photosensitive drum and a developing roller, determines a correction amount of light amount for each one of the predetermined pixels in accordance with the obtained number of pixels, and generates image formation data.

Abstract: A technique for effectively detecting abnormal values in electromagnetic wave measurement is provided. An electromagnetic wave measuring device includes a measurement data receiving unit 308, an abnormal value detecting unit 309, and a GUI controlling unit 306. The measurement data receiving unit 308 receives measurement data of electromagnetic waves that are measured at multiple positions. The abnormal value detecting unit 309 detects an abnormal value in the measurement data. The GUI controlling unit 306 displays a position at which the abnormal value is measured, on a display.

Abstract: The invention provides an illuminance measuring system, which comprises an illuminance measuring instrument which comprises a first communication unit and is moved by a moving vehicle, a position measuring means which comprises a second communication unit and measures a three-dimensional position of the illuminance measuring instrument and a data collector which comprises a third communication unit and a storage unit for storing positional information data of a predetermined measuring point, wherein the data collector moves the moving vehicle to the measuring point based on a position of the illuminance measuring instrument and the positional information data, an illuminance is measured and a position of the illuminance measuring instrument is measured, and wherein the data collector obtains an illuminance measurement result from the illuminance measuring instrument, obtains a measuring position from the position measuring means, and collects the illuminance measurement result and the measuring position in as

Abstract: An image forming apparatus obtains a number of pixels to be developed on a downstream side in a sub-scanning direction from the each one of the predetermined pixels, in order to correct a density increase that occurs at the trailing edge of an image to be formed in accordance with a peripheral speed difference between a photosensitive drum and a developing roller, determines a correction amount of light amount for each one of the predetermined pixels in accordance with the obtained number of pixels, and generates image formation data.

Abstract: A process of reducing a toner consumption amount is to be performed on a region within several tens of pixels from a rendering end. An excessive amount of toner is supplied from a toner supplying unit which faces a non-printing region of a photosensitive drum within several tens of pixels at most from an end portion of a printing region. Accordingly, if only contour pixels in the rendering end are processed by an existing processing system, the contour correction and the process of reducing a toner consumption amount may be simultaneously realized. A contour is calculated as a processing result of the existing processing system, and an existing process is performed on a contour portion. The process of reducing a toner consumption amount is performed on other portions.

Abstract: An example film forming device is provided with: a chamber for forming a film on a substrate; a supply tube for supplying a cleaning gas to the chamber; and a plasma generating unit, which is provided to the supply tube, and which generates plasma from the cleaning gas. The film forming device is characterized by being provided with: a temperature control unit that controls the temperature of the supply tube to temperature equal to or higher than a predetermined temperature; and a supply unit which supplies, each time when a previously set time equal to or shorter than 36 hours elapses, the chamber with the plasma thus generated by the plasma generating unit.

Abstract: The invention provides an illuminance measuring system, which comprises an illuminance measuring instrument which comprises a first communication unit and is moved by a moving vehicle, a position measuring means which comprises a second communication unit and is capable of measuring a three-dimensional position of the illuminance measuring instrument and a data collector which comprises a third communication unit and a storage unit for storing positional information data of a predetermined measuring point, wherein the data collector moves the moving vehicle to the measuring point based on a position of the illuminance measuring instrument as measured by the position measuring means and the positional information data, an illuminance is measured by the illuminance measuring instrument and a position of the illuminance measuring instrument at the time of illuminance measurement is measured by the position measuring means, and wherein the data collector obtains an illuminance measurement result from the illumina