Patents by Inventor Atsushi Takayanagi
Atsushi Takayanagi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8206900Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 2 and mutated sequences thereof.Type: GrantFiled: March 11, 2011Date of Patent: June 26, 2012Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 8178320Abstract: An artificial antibody library with a super-repertory (1011 or more) is constructed by: using a cDNA library as a template, amplifying a fragment containing the CDR1 and CDR2s regions of the VH or VL region of immunoglobulin gene and a fragment containing the CDR3 region each by the PCR method; integrating the VH library and the VL library, which are little contaminated with unexpressionable repertory and have high safety, into an non-expression vector; transferring it into a host; and then shuffling the VH region in the VH library with the VL region in the VL library.Type: GrantFiled: November 22, 2002Date of Patent: May 15, 2012Assignee: Keio UniversityInventors: Nobuyoshi Shimizu, Atsushi Takayanagi, Michiyo Okui
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Patent number: 8169162Abstract: The present invention is directed to an apparatus for suppressing abnormal electrical discharge used for vacuum equipment which supplies power from a high-frequency power source to a plasma reaction chamber and executes a film formation process, provided with a power controller for controlling the high-frequency power source based on a deviation between a power command value and a power feedback value, and a cutoff controller for cutting off the power supply from the high-frequency power source to the plasma reaction chamber, based on a detection of the abnormal electrical discharge within the plasma reaction chamber. The cutoff controller exercises a first handling cutoff control and a second handling cutoff control, each having a different cutoff time. The first handling cutoff allows ions to remain in the plasma reaction chamber, and exercises the cutoff control over the high-frequency power source within a time duration which allows an arcing element to disappear.Type: GrantFiled: July 14, 2008Date of Patent: May 1, 2012Assignee: Kyosan Electric Mfg. Co., Ltd.Inventors: Itsuo Yuzurihara, Atsushi Takayanagi
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Patent number: 8163486Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 3 and mutated sequences thereof.Type: GrantFiled: November 17, 2010Date of Patent: April 24, 2012Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 8153371Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 4 and mutated sequences thereof.Type: GrantFiled: November 17, 2010Date of Patent: April 10, 2012Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 8049001Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 4 and mutated sequences thereof.Type: GrantFiled: May 13, 2008Date of Patent: November 1, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 8039607Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 2 and mutated sequences thereof.Type: GrantFiled: May 13, 2008Date of Patent: October 18, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 8034918Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 2 and mutated sequences thereof.Type: GrantFiled: May 13, 2008Date of Patent: October 11, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 8034919Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 4 and mutated sequences thereof.Type: GrantFiled: May 13, 2008Date of Patent: October 11, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Publication number: 20110245109Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 3 and mutated sequences thereof.Type: ApplicationFiled: May 9, 2011Publication date: October 6, 2011Applicant: CANON KABUSHIKI KAISHAInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 8030001Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 4 and mutated sequences thereof.Type: GrantFiled: March 2, 2010Date of Patent: October 4, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 8026061Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 3 and mutated sequences thereof.Type: GrantFiled: May 9, 2011Date of Patent: September 27, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 8003321Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 3 and mutated sequences thereof.Type: GrantFiled: May 13, 2008Date of Patent: August 23, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 7998675Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 2 and mutated sequences thereof.Type: GrantFiled: May 13, 2008Date of Patent: August 16, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 7993846Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 3 and mutated sequences thereof.Type: GrantFiled: January 11, 2011Date of Patent: August 9, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 7985544Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 2 and mutated sequences thereof.Type: GrantFiled: May 13, 2008Date of Patent: July 26, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 7985545Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 2 and mutated sequences thereof.Type: GrantFiled: May 13, 2008Date of Patent: July 26, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 7960538Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 3 and mutated sequences thereof.Type: GrantFiled: May 13, 2008Date of Patent: June 14, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Patent number: 7960539Abstract: A probe, a set of probes, and a probe carrier on which the probe or the set of probes is immobilized, are provided for classification of fungus species. The probe or the set of probes is capable of collectively detecting fungus of the same species and distinguishingly detecting those fungus from fungus of other species. The probe is an oligonucleotide probe for detecting a pathogenic fungus DNA and includes at least one of base sequences of SEQ ID NOS. 1 to 2 and mutated sequences thereof.Type: GrantFiled: May 13, 2008Date of Patent: June 14, 2011Assignee: Canon Kabushiki KaishaInventors: Nobuhiro Tomatsu, Toshifumi Fukui, Nobuyoshi Shimizu, Atsushi Takayanagi
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Publication number: 20110134669Abstract: In compensating for unbalanced voltages of three-phase AC, instantaneous values of wye-phase voltages 120° out of phase with each other are obtained from line voltages using a centroid vector operation, symmetrical component voltages of three-phase balanced system are obtained from the instantaneous values of wye-phase voltages, a compensation signal to compensate unbalanced voltages of three-phase AC is generated from zero-phase-sequence voltage of symmetrical component voltages is generated, wye-phase voltages 120° out of phase, the unbalanced voltages of which are compensated, are obtained from the compensation signal and the symmetrical component voltages, a control signal of a PWM conversion is generated based on the compensated wye-phase voltage compensated, and the unbalanced voltages of three-phase AC are compensated. The amount of time to compensate the three-phase unbalanced voltages required for detecting an unbalance of voltages and generating a control signal can be shortened.Type: ApplicationFiled: December 2, 2010Publication date: June 9, 2011Applicant: KYOSAN ELECTRIC MFG. CO., LTD.Inventors: Itsuo Yuzurihara, Atsushi Takayanagi, Yoshihisa Hata