Patents by Inventor Atsushi Yamagoshi
Atsushi Yamagoshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7260176Abstract: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first capacitor having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first capacitor, and an integrator having a second resistor and a second capacitor each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first capacitor are returned to a steady state after irradiation of the pulsed X-ray.Type: GrantFiled: September 13, 2006Date of Patent: August 21, 2007Assignee: Hitachi, Ltd.Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Publication number: 20070009082Abstract: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first condenser having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first condenser, and an integrator having a second resistor and a second condenser each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first condenser are returned to a steady state after irradiation of the pulsed X-ray.Type: ApplicationFiled: September 13, 2006Publication date: January 11, 2007Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Patent number: 7151262Abstract: To provide a radioactive gas measurement apparatus that is simply constructed and can efficiently measure Xe-133 in a radioactive gas on-line under the condition that the radioactive gas is mixed with interference N-13, an apparatus is provided for measuring a radiation emitted from Xe-133, including an anticoincidence counter circuit 13 that conducts counting if it receives an output of a main detector 1 when it does not receive outputs of scintillation detectors 2 and 9, and a gate circuit 14, a plate-shaped semiconductor detector is used as the main detector 1, and a material not emitting a characteristic X ray in the range from 70 to 90 keV is used for a shielding structure. In particular, the thickness of the semiconductor detector 1 is set to fall within a range from 2 mm to 7 mm, thereby improving the analysis precision.Type: GrantFiled: June 22, 2004Date of Patent: December 19, 2006Assignee: Hitachi, Ltd.Inventors: Hiroshi Kitaguchi, Atsushi Yamagoshi, Shigeru Izumi, Tetsuya Matsui, Akihisa Kaihara
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Publication number: 20060278828Abstract: To provide a radioactive gas measurement apparatus that is simply constructed and can efficiently measure Xe-133 in a radioactive gas on-line under the condition that the radioactive gas is mixed with interference N-13, an apparatus is provided for measuring a radiation emitted from Xe-133, including an anticoincidence counter circuit 13 that conducts counting if it receives an output of a main detector 1 when it does not receive outputs of scintillation detectors 2 and 9, and a gate circuit 14, a plate-shaped semiconductor detector is used as the main detector 1, and a material not emitting a characteristic X ray in the range from 70 to 90 keV is used for a shielding structure. In particular, the thickness of the semiconductor detector 1 is set to fall within a range from 2 mm to 7 mm, thereby improving the analysis precision.Type: ApplicationFiled: June 22, 2004Publication date: December 14, 2006Inventors: Hiroshi Kitaguchi, Atsushi Yamagoshi, Shigeru Izumi, Tetsuya Matsui, Akihisa Kaihara
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Patent number: 7113563Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.Type: GrantFiled: October 17, 2005Date of Patent: September 26, 2006Assignee: Hitachi, Ltd.Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Publication number: 20060034420Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.Type: ApplicationFiled: October 17, 2005Publication date: February 16, 2006Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Patent number: 6975700Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor, and an integration circuit for integrating the output signal of the X-ray sensor from which the DC component is removed by the filter.Type: GrantFiled: June 10, 2004Date of Patent: December 13, 2005Assignee: Hitachi, Ltd.Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Patent number: 6928138Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor and a circuit for obtaining a difference between a voltage corresponding to a current including a dark current generated in the X-ray sensor by incidence of the X-ray and a voltage corresponding to the dark current.Type: GrantFiled: June 10, 2004Date of Patent: August 9, 2005Assignee: Hitachi, Ltd.Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Patent number: 6925143Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray semiconductor sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray semiconductor sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray semiconductor sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray semiconductor sensor, and an integration circuit for integrating an output signal of the X-ray semiconductor sensor from which the DC component is removed by the filter.Type: GrantFiled: June 10, 2004Date of Patent: August 2, 2005Assignee: Hitachi, Ltd.Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Patent number: 6859511Abstract: An X-ray sensor signal processor including capacitors 114 for removing DC components (dark currents) from output signals of semiconductor sensors 21 to 2n detecting pulse-like X-rays passed through an object, and integrators (each of which is constituted by a combination of an operational amplifier 115, a resistor 116 and a capacitor 117) for integrating the output signals of the X-ray sensors after removal of the DC components by the capacitors 114. By this, a value proportional to the average number of photons in X-rays can be obtained even in the case where a small number of incident photons are given, and an X-ray CT system using the X-ray sensor signal processor.Type: GrantFiled: February 8, 2002Date of Patent: February 22, 2005Assignee: Hitachi, Ltd.Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Publication number: 20040264633Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor, and an integration circuit for integrating the output signal of the X-ray sensor from which the DC component is removed by the filter.Type: ApplicationFiled: June 10, 2004Publication date: December 30, 2004Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Publication number: 20040234024Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor and a circuit for obtaining a difference between a voltage corresponding to a current including a dark current generated in the X-ray sensor by incidence of the X-ray and a voltage corresponding to the dark current.Type: ApplicationFiled: June 10, 2004Publication date: November 25, 2004Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Publication number: 20040223582Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray semiconductor sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray semiconductor sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray semiconductor sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray semiconductor sensor, and an integration circuit for integrating an output signal of the X-ray semiconductor sensor from which the DC component is removed by the filter.Type: ApplicationFiled: June 10, 2004Publication date: November 11, 2004Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Publication number: 20020154729Abstract: An X-ray sensor signal processor including capacitors 114 for removing DC components (dark currents) from output signals of semiconductor sensors 21 to 2n detecting pulse-like X-rays passed through an object, and integrators (each of which is constituted by a combination of an operational amplifier 115, a resistor 116 and a capacitor 117) for integrating the output signals of the X-ray sensors after removal of the DC components by the capacitors 114. By this, a value proportional to the average number of photons in X-rays can be obtained even in the case where a small number of incident photons are given, and an X-ray CT system using the X-ray sensor signal processor.Type: ApplicationFiled: February 8, 2002Publication date: October 24, 2002Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Publication number: 20020084420Abstract: To provide a radioactive gas measurement apparatus that is simply constructed and can efficiently measure Xe-133 in a radioactive gas on-line under the condition that the radioactive gas is mixed with interference N-13, an apparatus is provided for measuring a radiation emitted from Xe-133, including an anticoincidence counter circuit 13 that conducts counting if it receives an output of a main detector 1 when it does not receive outputs of scintillation detectors 2 and 9, and a gate circuit 14, a plate-shaped semiconductor detector is used as the main detector 1, and a material not emitting a characteristic X ray in the range from 70 to 90 keV is used for a shielding structure. In particular, the thickness of the semiconductor detector 1 is set to fall within a range from 2 mm to 7 mm, thereby improving the analysis precision.Type: ApplicationFiled: February 28, 2002Publication date: July 4, 2002Applicant: Hitachi, Ltd.Inventors: Hiroshi Kitaguchi, Atsushi Yamagoshi, Shigeru Izumi, Tetsuya Matsui, Akihisa Kaihara
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Patent number: 6366636Abstract: An X-ray sensor signal processor including capacitors 114 for removing DC components (dark currents) from output signals of semiconductor sensors 21 to 2n detecting pulse-like X-rays passed through an object, and integrators (each of which is constituted by a combination of an operational amplifier 115, a resistor 116 and a capacitor 117) for integrating the output signals of the X-ray sensors after removal of the DC components by the capacitors 114. By this, a value proportional to the average number of photons in X-rays can be obtained even in the case where a small number of incident photons are given, and an X-ray CT system using the X-ray sensor signal processor.Type: GrantFiled: March 3, 2000Date of Patent: April 2, 2002Assignee: Hitachi, Ltd.Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh