Abstract: Under the control of an analysis control unit (5), a mass spectrometer unit (2) performs a product-ion scan measurement for a target component in a target sample within a time range where the component is introduced. It also performs a scan measurement over an m/z range including the m/z of an ion originating from a standard component within the same segment of time. A mass correction information calculator (42) calculates mass correction information from measured and theoretical values of the m/z of the ion originating from the standard component observed on an MS spectrum obtained by the scan measurement. Using the mass correction information, a mass corrector (43) corrects the m/z of each ion peak originating from the target component observed on an MS/MS spectrum obtained by the product-ion scan measurement performed within the same cycle as the scan measurement concerned.

Abstract: Before measurement, as a measurement end condition through an input unit (5), an analyst selects a chromatogram (chromatogram at a specific wavelength or across the entire wavelength) of a peak detection target and specifies a determination value for the number of peaks. During execution of measurement by a measurement unit (1), a chromatogram production unit (22) produces a chromatogram substantially in real time based on collected data, and a peak detection unit (23) detects a peak on the chromatogram. A measurement end condition determining unit (24) counts the number of detected peaks, and determines that the measurement end condition is satisfied when the counted number has reached the determination value for the number of peaks, and a measurement end timing determination unit (25) instructs an analysis control unit (3) to end the measurement when a predetermined time has elapsed since the determination.

Abstract: A reference value selection unit selects a reference value that lies in a predetermined margin from reference sample data corresponding to a set reference sample. A data acquisition unit acquires mass spectrum data in a data acquisition range including a set analysis range and the margin. A data correction unit corrects the mass spectrum data based on the reference value and a measured value on the reference sample in the data acquisition range. When no reference value lies in the margin, the reference value selection unit selects a reference value that lies outside the analysis range but closest to the margin. The data acquisition unit acquires mass spectrum data in a data acquisition range expanded to allow the reference value to lie in the data acquisition range. The data correction unit corrects the mass spectrum data based on the reference value and the measured value in the data acquisition range.

Abstract: Upon a setting of a reference sample and a setting of an analysis range being received, a reference value selection unit 64 selects a reference value that lies in a predetermined margin from reference sample data 51 corresponding to the reference sample thus set. A data acquisition unit 63 acquires mass spectrum data in a data acquisition range including the analysis range thus set and the margin. A data correction unit 65 corrects the mass spectrum data based on the reference value thus selected and an actual measured value on the reference sample in the data acquisition range. When no reference value lies in a range of the margin, the reference value selection unit 64 selects a reference value that lies outside the analysis range but closest to the range of the margin. The data acquisition unit 63 acquires mass spectrum data in a data acquisition range in which the margin is expanded to allow the reference value thus selected to lie in the data acquisition range.

Abstract: Under the control of an analysis control unit (5), a mass spectrometer unit (2) performs a product-ion scan measurement for a target component in a target sample within a time range where the component is introduced. It also performs a scan measurement over an m/z range including the m/z of an ion originating from a standard component within the same segment of time. A mass correction information calculator (42) calculates mass correction information from measured and theoretical values of the m/z of the ion originating from the standard component observed on an MS spectrum obtained by the scan measurement. Using the mass correction information, a mass corrector (43) corrects the m/z of each ion peak originating from the target component observed on an MS/MS spectrum obtained by the product-ion scan measurement performed within the same cycle as the scan measurement concerned.