Patents by Inventor Atsuto Ohta

Atsuto Ohta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inspection method and apparatus for EL array substrate
    Patent number: 6930505
    Abstract: To provide an inspection method for an EL array substrate that can detect a failure on the EL array substrate before assembling an EL panel. By giving a prescribed potential to a data line 6 to turn on a switching transistor 4 for a prescribed time, a holding capacitor 3 and a parasitic capacitor 8 are charged. By turning on again the switching transistor 4 after a lapse of a prescribed time from turning-off of the switching transistor 4 and by connecting the data line 6 to an integrator 10, the holding capacitor 3 and the parasitic capacitor 8 are discharged, and a discharged amount of charge is detected by the integrator 10. Based on this amount of charge, a failure on an EL array substrate is detected before assembling an EL panel.
    Type: Grant
    Filed: March 26, 2003
    Date of Patent: August 16, 2005
    Assignee: International Business Machines Corporation
    Inventors: Tomoyuki Taguchi, Atsuto Ohta
  • INSPECTION METHOD AND APPARATUS FOR EL ARRAY SUBSTRATE
    Publication number: 20030187597
    Abstract: To provide an inspection method for an EL array substrate that can detect a failure on the EL array substrate before assembling an EL panel. By giving a prescribed potential to a data line 6 to turn on a switching transistor 4 for a prescribed time, a holding capacitor 3 and a parasitic capacitor 8 are charged. By turning on again the switching transistor 4 after a lapse of a prescribed time from turning-off of the switching transistor 4 and by connecting the data line 6 to an integrator 10, the holding capacitor 3 and the parasitic capacitor 8 are discharged, and a discharged amount of charge is detected by the integrator 10. Based on this amount of charge, a failure on an EL array substrate is detected before assembling an EL panel.
    Type: Application
    Filed: March 26, 2003
    Publication date: October 2, 2003
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Tomoyuki Taguchi, Atsuto Ohta