Patents by Inventor Attila Lengyel
Attila Lengyel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8825190Abstract: Priority can be calculated for works-in-process which are not in demand. A priority calculation device (110) comprises a priority calculation unit (124) which specifies a queue of lots in each production stage, a product category wherein the lot is to be used, and the number of components included in the lot, on the basis of information stored in a queue information storage area (115), and allocates priority for each lot so that when the specified lot is supplied to the production stage, a lot, by which a ratio of a component, in each product category, contained in a lot which is in a process subsequent to the process of the production stage is made closer to the ratio of demand in each product category specified by the information stored in a demand information storage area (113), is supplied into the production stage with higher priority.Type: GrantFiled: November 4, 2009Date of Patent: September 2, 2014Assignee: Hitachi, Ltd.Inventors: Attila Lengyel, Yoichi Nonaka
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Patent number: 8600535Abstract: Disclosed are a device, a system, and a method for setting standard work times that take real-world manufacturing capabilities into account. Provided is a standard work time calculation device (10), which analyzes fluctuations in production line assessment indices on a per time period basis, and computes standard work times for each region, as classified according to the degree of fluctuation. The standard work time calculation device (10) comprises a fluctuation coefficient computation unit (111), which computes coefficients of fluctuation for the assessment indices, a fluctuation region identification unit (112), which identifies regions of fluctuation with coefficients of fluctuation that are greater than or equal to predetermined thresholds, and a standard work time computation unit (113), which computes standard work times for regions of fluctuation.Type: GrantFiled: November 4, 2009Date of Patent: December 3, 2013Assignee: Hitachi, Ltd.Inventors: Youichi Nonaka, Makoto Ono, Hisaya Ishibashi, Attila Lengyel, Yuuichi Suginishi, Tomotoshi Ishida
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Publication number: 20120158167Abstract: Priority can be calculated for works-in-process which are not in demand. A priority calculation device (110) comprises a priority calculation unit (124) which specifies a queue of lots in each production stage, a product category wherein the lot is to be used, and the number of components included in the lot, on the basis of information stored in a queue information storage area (115), and allocates priority for each lot so that when the specified lot is supplied to the production stage, a lot, by which a ratio of a component, in each product category, contained in a lot which is in a process subsequent to the process of the production stage is made closer to the ratio of demand in each product category specified by the information stored in a demand information storage area (113), is supplied into the production stage with higher priority.Type: ApplicationFiled: November 4, 2009Publication date: June 21, 2012Inventors: Attila Lengyel, Yoichi Nonaka
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Publication number: 20110276162Abstract: Disclosed are a device, a system, and a method for setting standard work times that take real-world manufacturing capabilities into account. Provided is a standard work time calculation device (10), which analyzes fluctuations in production line assessment indices on a per time period basis, and computes standard work times for each region, as classified according to the degree of fluctuation. The standard work time calculation device (10) comprises a fluctuation coefficient computation unit (111), which computes coefficients of fluctuation for the assessment indices, a fluctuation region identification unit (112), which identifies regions of fluctuation with coefficients of fluctuation that are greater than or equal to predetermined thresholds, and a standard work time computation unit (113), which computes standard work times for regions of fluctuation.Type: ApplicationFiled: November 4, 2009Publication date: November 10, 2011Inventors: Youichi Nonaka, Makoto Ono, Hisaya Ishibashi, Attila Lengyel, Yuuichi Suginishi, Tomotoshi Ishida
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Patent number: 7885723Abstract: Technology is provided for changing a mounting angle of a component to reduce the amount of relative displacement between a mounting head and a board. A component, for which a mounting angle can be changed, is specified based on information stored in a mounting data storage area and a component data storage area according to a predetermined component mounting order. A mounting time in a mounting path with the mounting angle of the specified component being changed is calculated for each mounting angle to specify the mounting path requiring the shortest mounting time.Type: GrantFiled: July 5, 2007Date of Patent: February 8, 2011Assignee: Hitachi High-Tech Instruments Co., Ltd.Inventors: Takafumi Chida, Attila Lengyel, Ken Igarashi, Haruhiko Yamaguchi, Manabu Okamoto, Koichi Izuhara
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Publication number: 20080005892Abstract: Technology is provided for changing a mounting angle of a component to reduce the amount of relative displacement between a mounting head and a board. A component, for which a mounting angle can be changed, is specified based on information stored in a mounting data storage area and a component data storage area according to a predetermined component mounting order. A mounting time in a mounting path with the mounting angle of the specified component being changed is calculated for each mounting angle to specify the mounting path requiring the shortest mounting time.Type: ApplicationFiled: July 5, 2007Publication date: January 10, 2008Inventors: Takafumi Chida, Attila Lengyel, Ken Igarashi, Haruhiko Yamaguchi, Manabu Okamoto, Koichi Izuhara
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Patent number: 7167009Abstract: A method and apparatus for determining an electrical property of a structure. The method involves creating a model of an electrical property of a structure and measuring the electrical property of the structure between at least two of a plurality of locations. The method also involves determining the electrical property of at least a portion of the structure based on the model and the measurement of the electrical property between the at least two of the plurality of locations.Type: GrantFiled: September 24, 2004Date of Patent: January 23, 2007Assignee: Mide Technology CorporationInventors: Marthinus van Schoor, Andrew M. Cutler, Gert J. Muller, Attila Lengyel, Brooks Radighieri
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Publication number: 20070006652Abstract: Systems and methods for measuring a load in a structural element include placing at least one actuator and sensor on the structural element. The actuator is capable of exciting a wave of a predetermined frequency in the structural element and the sensor is capable of sensing the wave excited in the structural element. A computer control unit is applied to operate the actuator so as to excite a wave in the structural member in at least a first frequency, and to operate the sensor so as to measure at least one of a change in a resonance frequency in the structural element as a result of a change in loading on the structural member and a change in phase angle in the wave sensed by the sensor as a result of a change in loading on the structural member.Type: ApplicationFiled: January 31, 2006Publication date: January 11, 2007Applicant: Abnaki Systems, Inc.Inventors: James Weldon, Marthinus van Schoor, Attila Lengyel
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Publication number: 20050139001Abstract: A method and apparatus for determining an electrical property of a structure. The method involves creating a model of an electrical property of a structure and measuring the electrical property of the structure between at least two of a plurality of locations. The method also involves determining the electrical property of at least a portion of the structure based on the model and the measurement of the electrical property between the at least two of the plurality of locations.Type: ApplicationFiled: September 24, 2004Publication date: June 30, 2005Applicant: MIDE TECHNOLOGY CORPORATIONInventors: Marthinus van Schoor, Andrew Cutler, Gert Muller, Attila Lengyel, Brooks Radighieri
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Patent number: 6802216Abstract: A method and sheet-like sensor for measuring stress distribution including a grid of members which change in resistance when subjected to strain, the members intersecting at internal nodes and intersecting at boundary nodes at the periphery of the grid defining a plurality of legs. An analyzer is electrically connected only to the boundary nodes and configured to calculate any change in resistance in all of the legs based solely on the measured resistance of the legs between the boundary nodes.Type: GrantFiled: October 23, 2002Date of Patent: October 12, 2004Assignee: MIDE TechnologyInventors: Marthinus van Schoor, Attila Lengyel, Gert Johannes Muller, Brooks Radighieri
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Publication number: 20040025985Abstract: Impact resistant components and methods of protecting structures from impacts. The components are interposed between a potential point of impact and a structure to be protected. They comprise a shape memory alloy (SMA) exhibiting pseudoelastic behavior, and having a high strain to failure.Type: ApplicationFiled: January 31, 2003Publication date: February 12, 2004Applicant: Mide Technology CorporationInventors: Marthinus C. van Schoor, Attila Lengyel, Brett P. Masters, John P. Rodgers
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Publication number: 20030196485Abstract: A method and sheet-like sensor for measuring stress distribution including a grid of members which change in resistance when subjected to strain, the members intersecting at internal nodes and intersecting at boundary nodes at the periphery of the grid defining a plurality of legs. An analyzer is electrically connected only to the boundary nodes and configured to calculate any change in resistance in all of the legs based solely on the measured resistance of the legs between the boundary nodes.Type: ApplicationFiled: October 23, 2002Publication date: October 23, 2003Inventors: Marthinus van Schoor, Attila Lengyel, Gert Johannes Muller, Brooks Radighieri
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Patent number: 6550341Abstract: An article and method for measuring strain using a strain gauge made of a shape memory y alloy, and preferably a pseudoelastic alloy, is disclosed. The strain gauge includes an element that preferably is attached to a substrate and mounted on an object, or is woven or stitched to a fabric to measure the strain experienced under an applied stress. The preferred pseudoelastic alloy is Nitinol, which in pseudoelastic form can elongate by up to approximately 8% to accommodate strain in an object or fabric. When woven into a fabric, a Nitinol-based strain gauge can measure strains of up to approximately 20% in the fabric. The strain gauge can be used in such applications as automotive and aircraft seatbelts, parachute canopies and static lines, and commercial cargo nets.Type: GrantFiled: July 27, 2001Date of Patent: April 22, 2003Assignee: Mide Technology CorporationInventors: Marthinus Cornelius van Schoor, Attila Lengyel, Gert Johannes Muller, Andries Jacobus du Plessis
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Publication number: 20030056599Abstract: An article and method for measuring strain using a strain gauge made of a shape memory alloy, and preferably a pseudoelastic alloy, is disclosed. The strain gauge includes an element that preferably is attached to a substrate and mounted on an object, or is woven or stitched to a fabric to measure the strain experienced under an applied stress. The preferred pseudoelastic alloy is Nitinol, which in pseudoelastic form can elongate by up to approximately 8% to accommodate strain in an object or fabric. When woven into a fabric, a Nitinol-based strain gauge can measure strains of up to approximately 20% in the fabric. The strain gauge can be used in such applications as automotive and aircraft seatbelts, parachute canopies and static lines, and commercial cargo nets.Type: ApplicationFiled: July 27, 2001Publication date: March 27, 2003Inventors: Marthinus Cornelius van Schoor, Attila Lengyel, Gert Johannes Muller, Andries Jacobus du Plessis