Abstract: Circuitry generates base-to-emitter voltages (Vbe1, Vbe2) of two BJTs biased at different current densities, a base-to-emitter voltage (Vbe) of a BJT biased so Vbe is complementary to absolute temperature and has a curved non-linearity across temperature, and base-to-emitter voltages (Vbe1_c, Vbe2_c) of two BJTs biased by a temperature independent constant current and a current proportional to absolute temperature so Vbe2_c?Vbe1_c has the same but opposite curved non-linearity across temperature as Vbe. A sampling circuit samples these voltages and provides them to inputs of a loop filter. Filter outputs are quantized to produce a bitstream.

Abstract: A temperature sensing circuit a switched capacitor circuit selectively samples ?Vbe and Vbe voltages and provides the sampled voltages to inputs of an integrator. A quantization circuit quantizes outputs of the integrator to produce a bitstream. When a most recent bit of the bitstream is a logic zero, operation includes sampling and integration of ?Vbe a first given number of times to produce a voltage proportional to absolute temperature. When the most recent bit of the bitstream is a logic one, operation includes cause sampling and integration of Vbe a second given number of times to produce a voltage complementary to absolute temperature. A low pass filter and decimator filters and decimates the bitstream produced by the quantization circuit to produce a signal indicative of a temperature of a chip into which the temperature sensing circuit is placed.

Abstract: A temperature sensing circuit includes a current generation circuit generating an initial current proportional to absolute temperature (Iptat), and a voltage generation circuit configured to mirror Iptat using an adjustable current source to produce a scaled current and to source the scaled current to a first terminal of a resistor to produce a reference voltage at the first terminal. A second terminal of the resistor has a voltage complementary to absolute temperature (Vctat) applied thereto. An analog-to-digital converter (ADC) has a reference input receiving the reference voltage, and a data input receiving Vctat or an externally sourced voltage. The ADC generates an output code indicative of a ratio between: a) either Vctat or the externally sourced voltage, and b) the reference voltage. A digital circuit determines a temperature readout from the output code and calibrates the reference voltage and the temperature readout determination based upon the output code.

Abstract: A temperature sensing circuit a switched capacitor circuit selectively samples ?Vbe and Vbe voltages and provides the sampled voltages to inputs of an integrator. A quantization circuit quantizes outputs of the integrator to produce a bitstream. When a most recent bit of the bitstream is a logic zero, operation includes sampling and integration of ?Vbe a first given number of times to produce a voltage proportional to absolute temperature. When the most recent bit of the bitstream is a logic one, operation includes cause sampling and integration of Vbe a second given number of times to produce a voltage complementary to absolute temperature. A low pass filter and decimator filters and decimates the bitstream produced by the quantization circuit to produce a signal indicative of a temperature of a chip into which the temperature sensing circuit is placed.

Abstract: Circuitry generates base-to-emitter voltages (Vbe1, Vbe2) of two BJTs biased at different current densities, a base-to-emitter voltage (Vbe) of a BJT biased so Vbe is complementary to absolute temperature and has a curved non-linearity across temperature, and base-to-emitter voltages (Vbe1_c, Vbe2_c) of two BJTs biased by a temperature independent constant current and a current proportional to absolute temperature so Vbe2_c?Vbe1_c has the same but opposite curved non-linearity across temperature as Vbe. A sampling circuit samples these voltages and provides them to inputs of a loop filter. Filter outputs are quantized to produce a bitstream.

Abstract: One or more embodiments are directed to inter-integrated circuit (I2C) transmitters, receivers, and devices that utilize a stable reference voltage for driving a pre-driver of the transmitter and for driving a first input stage of the receiver. One embodiment is directed to a device A device that includes an inter-integrated circuit (I2C) transmitter and an I2C receiver. The I2C transmitter includes a driver coupled to an I2C data line, and a pre-driver coupled to a variable first supply voltage, a second supply voltage, and a reference voltage. The pre-driver is configured to output a control signal to a control terminal of the driver. The I2C receiver includes a first stage coupled to the I2C data line, the variable first supply voltage, the second supply voltage, and the reference voltage.

Abstract: A low-voltage-differential-signaling (LVDS) fault detector includes first and second LVDS lines, and a window comparator provides a first output indicating whether a difference between voltages at the first and second LVDS lines is greater than a threshold voltage, and a second output indicating whether a difference between the voltages at the second and first LVDS lines is greater than the threshold voltage. A charge circuit charges a capacitive node when either the first or second output is at a logic low, and discharges the capacitive node when neither the first nor second output is at a logic low. A Schmitt trigger generates a fault flag if charge on the capacitive node falls to a threshold.

Abstract: A low-voltage-differential-signaling (LVDS) fault detector includes first and second LVDS lines, and a window comparator provides a first output indicating whether a difference between voltages at the first and second LVDS lines is greater than a threshold voltage, and a second output indicating whether a difference between the voltages at the second and first LVDS lines is greater than the threshold voltage. A charge circuit charges a capacitive node when either the first or second output is at a logic low, and discharges the capacitive node when neither the first nor second output is at a logic low. A Schmitt trigger generates a fault flag if charge on the capacitive node falls to a threshold.

Abstract: One or more embodiments are directed to inter-integrated circuit (I2C) transmitters, receivers, and devices that utilize a stable reference voltage for driving a pre-driver of the transmitter and for driving a first input stage of the receiver. One embodiment is directed to a device A device that includes an inter-integrated circuit (I2C) transmitter and an I2C receiver. The I2C transmitter includes a driver coupled to an I2C data line, and a pre-driver coupled to a variable first supply voltage, a second supply voltage, and a reference voltage. The pre-driver is configured to output a control signal to a control terminal of the driver. The I2C receiver includes a first stage coupled to the I2C data line, the variable first supply voltage, the second supply voltage, and the reference voltage.