Abstract: The ability to assemble three-dimensional structures using diamagnetic particles suspended in solutions containing paramagnetic cations is described. The major advantages of this separation device are that: (i) it is a simple apparatus that does not require electric power (a set of permanent magnets and gravity are sufficient for the diamagnetic separation and collection system to work); ii) the assembled structures can be removed from the paramagnetic solution for further processing after fixing the structure; iii) the assembly is fast; and iv) it is small, portable.

Abstract: The ability to levitate and detect height and orientation of diamagnetic objects suspended in paramagnetic solutions using an inhomogeneous magnetic field is described. By comparing the measured height and orientation of a sample material with the measured height and orientation of a reference material, quality control of objects can be carried out. The major advantages of this quality control technique are: i) it is a simple apparatus that does not require electric power (a set of permanent magnets and gravity are sufficient for the diamagnetic separation and collection system to work); ii) it is compatible with simple optical detection; iii) it is a cost-effective and simple method that can carry out quality control between sample and reference materials rapidly.

Abstract: The ability to assemble three-dimensional structures using diamagnetic particles suspended in solutions containing paramagnetic cations is described. The major advantages of this separation device are that: (i) it is a simple apparatus that does not require electric power (a set of permanent magnets and gravity are sufficient for the diamagnetic separation and collection system to work); ii) the assembled structures can be removed from the paramagnetic solution for further processing after fixing the structure; iii) the assembly is fast; and iv) it is small, portable.

Abstract: The ability to levitate and detect height and orientation of diamagnetic objects suspended in paramagnetic solutions using an inhomogeneous magnetic field is described. By comparing the measured height and orientation of a sample material with the measured height and orientation of a reference material, quality control of objects can be carried out. The major advantages of this quality control technique are: i) it is a simple apparatus that does not require electric power (a set of permanent magnets and gravity are sufficient for the diamagnetic separation and collection system to work); ii) it is compatible with simple optical detection; iii) it is a cost-effective and simple method that can carry out quality control between sample and reference materials rapidly.

Abstract: A method for increasing the imaging rate for an optical coherence tomography system is disclosed. The method comprises generating an interferometric signal by interrogating each of M image points on a sample with a plurality of wavelength bands that are collectively spectrally interleaved, time encoding the interferometric signal, and sampling the time-encoded interferometric signal at a single detector.

Abstract: Structure profiles from optical interferometric data can be identified by obtaining a plurality of broadband interferometric optical profiles of a structure as a function of structure depth in an axial direction. Each of the plurality of interferometric optical profiles include a reference signal propagated through a reference path and a sample signal reflected from a sample reflector in the axial direction. An axial position corresponding to at least a portion of the structure is selected. Phase variations of the plurality of interferometric optical profiles are determined at the selected axial position. A physical displacement of the structure is identified based on the phase variations at the selected axial position.

Abstract: Structure profiles from optical interferometric data can be identified by obtaining a plurality of broadband interferometric optical profiles of a structure as a function of structure depth in an axial direction. Each of the plurality of interferometric optical profiles include a reference signal propagated through a reference path and a sample signal reflected from a sample reflector in the axial direction. An axial position corresponding to at least a portion of the structure is selected. Phase variations of the plurality of interferometric optical profiles are determined at the selected axial position. A physical displacement of the structure is identified based on the phase variations at the selected axial position.

Abstract: Structure profiles from optical interferometric data can be identified by obtaining a plurality of broadband interferometric optical profiles of a structure as a function of structure depth in an axial direction. Each of the plurality of interferometric optical profiles include a reference signal propagated through a reference path and a sample signal reflected from a sample reflector in the axial direction. An axial position corresponding to at least a portion of the structure is selected. Phase variations of the plurality of interferometric optical profiles are determined at the selected axial position. A physical displacement of the structure is identified based on the phase variations at the selected axial position.

Abstract: Structure profiles from optical interferometric data can be identified by obtaining a plurality of broadband interferometric optical profiles of a structure as a function of structure depth in an axial direction. Each of the plurality of interferometric optical profiles include a reference signal propagated through a reference path and a sample signal reflected from a sample reflector in the axial direction. An axial position corresponding to at least a portion of the structure is selected. Phase variations of the plurality of interferometric optical profiles are determined at the selected axial position. A physical displacement of the structure is identified based on the phase variations at the selected axial position.