Abstract: A plasma generation device includes: a substrate having a first surface and a second surface; a stripline resonant ring disposed on the first surface of the substrate, and defining a discharge gap; a pair of electrode extensions connected to the stripline resonant ring at the discharge gap; a ground plane disposed on the second surface of the substrate; a gas flow element configured to flow gas between at least one of: (1) the discharge gap, and (2) the pair of electrode extensions; and a structure disposed adjacent the substrate to form an enclosure that substantially encloses at least a region including the discharge gap and the electrode extensions, the enclosure being adapted to contain a plasma.

Abstract: A plasma generation device includes: a substrate having a first surface and a second surface; a stripline resonant ring disposed on the first surface of the substrate, and defining a discharge gap; a pair of electrode extensions connected to the stripline resonant ring at the discharge gap; a ground plane disposed on the second surface of the substrate; a gas flow element configured to flow gas between at least one of: (1) the discharge gap, and (2) the pair of electrode extensions; and a structure disposed adjacent the substrate to form an enclosure that substantially encloses at least a region including the discharge gap and the electrode extensions, the enclosure being adapted to contain a plasma.

Abstract: A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given spectrum output can be determined as a function of the abundance of ions in the sample or the abundance of ions corresponding to a base peak or another selected peak. In yet another embodiment, the collection of transients is terminated when a threshold signal to noise ratio is attained.

Abstract: A mass spectrometer comprises an ion detector, an analog-to-digital (A/D) converter, a sample adjuster, and an adder. The A/D converter is configured to generate digital samples representing an analog signal received from the ion detector during a mass scan. The adder is configured to sum the samples with corresponding unsuppressed samples representing analog signals received from the ion detector during previous mass scans, the summed samples defining a mass spectrum. The sample adjuster is configured to identify a peak defined by the samples and to suppress all but one of the samples defining the identified peak to enhance resolution of a peak in the mass spectrum.

Abstract: A mass spectrometer includes an ion detector, an analog-to-digital (A/D) converter, and a decimator. The analog-to-digital (A/D) converter is configured to receive and sample an analog signal from the ion detector thereby providing a first plurality of samples at a first rate. The decimator is configured to receive the first plurality of samples and to transmit, at a second rate, a second plurality of samples that are based on the first plurality of samples. The decimator is further configured to dynamically adjust the second rate so that memory requirements for the mass spectrometer are reduced.

Abstract: A method and apparatus for performing time of flight mass spectrometry wherein the number of sums of transients taken for generating a given spectra is determined as a function of a characteristic of the incoming data for that spectrum. For instance, the number of transient measurements taken for a given spectrum output can be determined as a function of the abundance of ions in the sample or the abundance of ions corresponding to a base peak or another selected peak. In yet another embodiment, the collection of transients is terminated when a threshold signal to noise ratio is attained.

Abstract: A mass spectrometer comprises an ion detector, an analog-to-digital (A/D) converter, a sample adjuster, and an adder. The A/D converter is configured to generate digital samples representing an analog signal received from the ion detector during a mass scan. The adder is configured to sum the samples with corresponding unsuppressed samples representing analog signals received from the ion detector during previous mass scans, the summed samples defining a mass spectrum. The sample adjuster is configured to identify a peak defined by the samples and to suppress all but one of the samples defining the identified peak to enhance resolution of a peak in the mass spectrum.

Abstract: A mass spectrometer comprises an ion detector, a first amplifier, a second amplifier, and a spectra combiner. The ion detector is configured to generate an analog signal indicative of ions detected by the ion detector. The first amplifier is configured to amplify the analog signal to provide a first amplified signal having a first gain relative to the analog signal. The second amplifier is configured to amplify the analog signal to provide a second amplified signal having a second gain relative to the analog signal, and the first gain is different than the second gain. The spectra combiner is configured to combine first summed digital samples of the first amplified signal with second summed digital samples of the second amplified signal.

Abstract: A mass spectrometer comprises an ion detector, an analog-to-digital (A/D) converter, a sample adjuster, and an adder. The A/D converter is configured to receive and sample an analog signal from the ion detector thereby providing a plurality of samples. The adder is configured to sum the samples, and the summed samples define a mass spectrum. The sample adjuster is configured to identify a peak defined by the samples and to suppress at least one of the samples of the peak such that a resolution of a peak within the mass spectrum is enhanced.

Abstract: A mass spectrometer includes an ion detector, an analog-to-digital (A/D) converter, and a decimator. The analog-to-digital (A/D) converter is configured to receive and sample an analog signal from the ion detector thereby providing a first plurality of samples at a first rate. The decimator is configured to receive the first plurality of samples and to transmit, at a second rate, a second plurality of samples that are based on the first plurality of samples. The decimator is further configured to dynamically adjust the second rate so that memory requirements for the mass spectrometer are reduced.

Abstract: A spectrometer having a reduced memory size. The spectrometer has an address register, a detector for generating a digital measurement, first and second memories and an adder. The first memory stores data words having a value less than a maximum value, at the register defined address. The adder adds the data value on the data bus to the digital measurement to generate a sum value that is divided into a low order part having a value less or equal to the maximum value and an overflow value. The second memory stores at least a portion of the sum value at a location specified by the register value if the overflow value is greater than zero.

Abstract: A spectrometer having a reduced memory size. The spectrometer has an address register, a detector for generating a digital measurement, first and second memories and an adder. The first memory stores data words having a value less than a maximum value, at the register defined address. The adder adds the data value on the data bus to the digital measurement to generate a sum value that is divided into a low order part having a value less or equal to the maximum value and an overflow value. The second memory stores at least a portion of the sum value at a location specified by the register value if the overflow value is greater than zero.