Patents by Inventor Aunik K. Rahman

Aunik K. Rahman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9909986
    Abstract: A terahertz scanning reflectometer system is described herein for in-situ measurement of polymer coating thickness, semiconductor wafer's surface sub-surface inspection in a non-destructive and non-invasive fashion with very high resolution (e.g., 25 nm or lower) and spectral profiling and imaging of surface and sub-surface of biological tissues (e.g., skin) in a non-invasive fashion.
    Type: Grant
    Filed: July 9, 2015
    Date of Patent: March 6, 2018
    Assignee: Applied Research and Photonics, Inc.
    Inventors: Anis Rahman, Aunik K. Rahman
  • Patent number: 9239290
    Abstract: A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.
    Type: Grant
    Filed: December 30, 2013
    Date of Patent: January 19, 2016
    Assignee: Applied Research and Photonics, Inc.
    Inventors: Anis Rahman, Aunik K. Rahman
  • Publication number: 20150316475
    Abstract: A terahertz scanning reflectometer system is described herein for in-situ measurement of polymer coating thickness, semiconductor wafer's surface sub-surface inspection in a non-destructive and non-invasive fashion with very high resolution (e.g., 25 nm or lower) and spectral profiling and imaging of surface and sub-surface of biological tissues (e.g., skin) in a non-invasive fashion.
    Type: Application
    Filed: July 9, 2015
    Publication date: November 5, 2015
    Inventors: Anis Rahman, Aunik K. Rahman
  • Patent number: 9093810
    Abstract: A high efficiency electro-optic dendrimer based technology for nanophotonic integrated circuit devices is presented. In particular, a high power terahertz (THz) source is implemented using an electro-optic dendrimer via electro-optic rectification. Electro-optic rectification provides inherent power scalability, because, pump-THz conversion is not limited either by emission saturation or by heat dissipation. Low dielectric loss and high electro-optic coefficient of dendrimer along with a waveguide structure provides higher output power and tunable THz power generation. A dendrimer fiber array is also disclosed by means of which the input/output signals are connected to multiple components and devices.
    Type: Grant
    Filed: October 25, 2011
    Date of Patent: July 28, 2015
    Assignee: Applied Research and Photonics, Inc.
    Inventors: Anis Rahman, Aunik K. Rahman
  • Publication number: 20140103215
    Abstract: A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.
    Type: Application
    Filed: December 30, 2013
    Publication date: April 17, 2014
    Inventors: Anis Rahman, Aunik K. Rahman
  • Patent number: 8620132
    Abstract: A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.
    Type: Grant
    Filed: March 16, 2012
    Date of Patent: December 31, 2013
    Inventors: Anis Rahman, Aunik K. Rahman
  • Publication number: 20120228507
    Abstract: A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.
    Type: Application
    Filed: March 16, 2012
    Publication date: September 13, 2012
    Inventors: Anis Rahman, Aunik K. Rahman
  • Publication number: 20120099827
    Abstract: A high efficiency electro-optic dendrimer based technology for nanophotonic integrated circuit devices is presented. In particular, a high power terahertz (THz) source is implemented using an electro-optic dendrimer via electro-optic rectification. Electro-optic rectification provides inherent power scalability, because, pump-THz conversion is not limited either by emission saturation or by heat dissipation. Low dielectric loss and high electro-optic coefficient of dendrimer along with a waveguide structure provides higher output power and tunable THz power generation. A dendrimer fiber array is also disclosed by means of which the input/output signals are connected to multiple components and devices.
    Type: Application
    Filed: October 25, 2011
    Publication date: April 26, 2012
    Inventors: Anis Rahman, Aunik K. Rahman
  • Patent number: 8050531
    Abstract: A high efficiency electro-optic dendrimer based technology for nanophotonic integrated circuit devices is presented. In particular, a high power terahertz (THz) source is implemented using an electro-optic dendrimer via electro-optic rectification. Electro-optic rectification provides inherent power scalability, because, pump-THz conversion is not limited either by emission saturation or by heat dissipation. Low dielectric loss and high electro-optic coefficient of dendrimer along with a waveguide structure provides higher output power and tunable THz power generation. A dendrimer fiber array is also disclosed by means of which the input/output signals are connected to multiple components and devices.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: November 1, 2011
    Inventors: Anis Rahman, Aunik K. Rahman
  • Patent number: 7919755
    Abstract: A high efficiency electro-optic dendrimer based technology for nanophotonic integrated circuit devices is presented. In particular, an electro-optic waveguide dendrimer for electro-optic sensor applications is implemented. A terahertz system for detecting and imaging objects is implemented using electro-optic dendrimer based terahertz emitters and probing sensors.
    Type: Grant
    Filed: September 27, 2007
    Date of Patent: April 5, 2011
    Inventors: Anis Rahman, Aunik K. Rahman
  • Publication number: 20080128618
    Abstract: A high efficiency electro-optic dendrimer based technology for nanophotonic integrated circuit devices is presented. In particular, an electro-optic waveguide dendrimer for electro-optic sensor applications is implemented. A terahertz system for detecting and imaging objects is implemented using electro-optic dendrimer based terahertz emitters and probing sensors.
    Type: Application
    Filed: September 27, 2007
    Publication date: June 5, 2008
    Inventors: Anis Rahman, Aunik K. Rahman