Abstract: A method for producing a thickness map of an object, the method being implemented via at least one pair of measurement pathways; the method including measuring, by means of optical sensors, the light reflected and/or scattered by two opposing surfaces of a reference object in order to obtain reference signals of the positions of the two reference surfaces, and of the object to be measured in order to obtain measurement signals of the positions of the two surfaces of the object, at a plurality of measuring points, determining thickness values for the measuring points on the basis of the measurement signals and a reference thickness, and producing a thickness map of the object on the basis of the thickness values.