Patents by Inventor Aurélien Stalder

Aurélien Stalder has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Compressed sensing reconstruction for multi-slice and multi-slab acquisitions
    Patent number: 10663549
    Abstract: A method for acquiring a three-dimensional image volume using a magnetic resonance imaging device includes performing a multi-slice or multi-slab acquisition process to acquire a plurality of slices or three-dimensional slabs corresponding to an imaged object. Each respective slice or three-dimensional slab included in the plurality of slices or three-dimensional slabs comprises k-space data. An iterative compressed-sensing reconstruction process is applied to jointly reconstruct the plurality of three-dimensional slabs as a single consistent volume. The iterative compressed-sensing reconstruction process solves a cost function comprising a summation of individual data fidelity terms corresponding to the plurality of three-dimensional slabs.
    Type: Grant
    Filed: November 25, 2014
    Date of Patent: May 26, 2020
    Assignee: Siemens Healthcare GmbH
    Inventors: Boris Mailhe, Mariappan S. Nadar, Aurélien Stalder, Qiu Wang, Michael Zenge
  • Determination of a measuring sequence for a magnetic resonance system
    Patent number: 9645216
    Abstract: A method and a measuring-sequence-determining device for determining a measuring sequence for a magnetic resonance system based on at least one intra-repetition-interval time parameter are provided. During the determination of the measuring sequence in a gradient-optimization method, gradient-pulse parameters of the measuring sequence are automatically optimized to reduce at least one gradient-pulse-parameter maximum value. As a boundary condition in the gradient-optimization method, the intra-repetition-interval time parameter is kept constant at least within a specified tolerance value.
    Type: Grant
    Filed: February 1, 2013
    Date of Patent: May 9, 2017
    Assignee: Siemens Aktiengesellschaft
    Inventors: Björn Heismann, Mathias Nittka, Peter Speier, Aurélien Stalder
  • Image-based waveform parameter estimation
    Patent number: 9498140
    Abstract: Disclosed herein is a framework for facilitating waveform parameter estimation. In accordance with one aspect, time-based waveforms are generated based on analysis planes positioned along a centerline of the vessel. A surface may be fitted to upslope regions of the waveforms to determine one or more waveform parameters based on intersection of the surface with the upslope regions.
    Type: Grant
    Filed: May 5, 2015
    Date of Patent: November 22, 2016
    Inventors: Patrick Magrath, Bruce S. Spottiswoode, Aurélien Stalder, Mehmet Akif Gulsun, Michael Markl
  • Compressed Sensing Reconstruction for Multi-Slice and Multi-Slab Acquisitions
    Publication number: 20160146915
    Abstract: A method for acquiring a three-dimensional image volume using a magnetic resonance imaging device includes performing a multi-slice or multi-slab acquisition process to acquire a plurality of slices or three-dimensional slabs corresponding to an imaged object. Each respective slice or three-dimensional slab included in the plurality of slices or three-dimensional slabs comprises k-space data. An iterative compressed-sensing reconstruction process is applied to jointly reconstruct the plurality of three-dimensional slabs as a single consistent volume. The iterative compressed-sensing reconstruction process solves a cost function comprising a summation of individual data fidelity terms corresponding to the plurality of three-dimensional slabs.
    Type: Application
    Filed: November 25, 2014
    Publication date: May 26, 2016
    Inventors: Boris Mailhe, Mariappan S. Nadar, Aurélien Stalder, Qiu Wang, Michael Zenge
  • Image-Based Waveform Parameter Estimation
    Publication number: 20150324977
    Abstract: Disclosed herein is a framework for facilitating waveform parameter estimation. In accordance with one aspect, time-based waveforms are generated based on analysis planes positioned along a centerline of the vessel. A surface may be fitted to upslope regions of the waveforms to determine one or more waveform parameters based on intersection of the surface with the upslope regions.
    Type: Application
    Filed: May 5, 2015
    Publication date: November 12, 2015
    Inventors: Patrick Magrath, Bruce S. Spottiswoode, Aurélien Stalder, Mehmet Akif Gulsun, Michael Markl
  • Determination of a Measuring Sequence for a Magnetic Resonance System
    Publication number: 20130200893
    Abstract: A method and a measuring-sequence-determining device for determining a measuring sequence for a magnetic resonance system based on at least one intra-repetition-interval time parameter are provided. During the determination of the measuring sequence in a gradient-optimization method, gradient-pulse parameters of the measuring sequence are automatically optimized to reduce at least one gradient-pulse-parameter maximum value. As a boundary condition in the gradient-optimization method, the intra-repetition-interval time parameter is kept constant at least within a specified tolerance value.
    Type: Application
    Filed: February 1, 2013
    Publication date: August 8, 2013
    Inventors: Björn Heismann, Mathias Nittka, Peter Speier, Aurélien Stalder