Abstract: The invention relates to methods and instruments for measuring daughter-ion spectra in reflector time-of-flight mass spectrometers with post-acceleration of parent and daughter ions selected by means of a parent-ion selector. The invention consists of using a second selector to mask out all or at least a large fraction of the parent ions as well as those metastable daughter ions, which are produced by the decomposition of parent ions after post-acceleration. These ions not only produce ‘ghost’ peaks but also a high level of background noise as well as a parent ion peak which is excessively saturated and cannot be evaluated. This peak's ion current is capable of damaging the detector.

Abstract: The invention relates to methods and instruments for measuring daughter-ion spectra in reflector time-of-flight mass spectrometers with post-acceleration of parent and daughter ions selected by means of a parent-ion selector. The invention consists of using a second selector to mask out all or at least a large fraction of the parent ions as well as those metastable daughter ions, which are produced by the decomposition of parent ions after post-acceleration. These ions not only produce ‘ghost’ peaks but also a high level of background noise as well as a parent ion peak which is excessively saturated and cannot be evaluated. This peak's ion current is capable of damaging the detector.