Patents by Inventor Austen Hearn

Austen Hearn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9026188
    Abstract: A measurement apparatus comprises a probe system (100) operably coupled, when in use, to a processing resource (134). The probe system (100) and the processing resource (134) are arranged, when in use, to measure an apparent thickness change of a volume of the medium (108) to be measured and to determine a physiological parameter using the measurement of the apparent thickness change.
    Type: Grant
    Filed: February 9, 2009
    Date of Patent: May 5, 2015
    Assignee: Lein Applied Diagnostics
    Inventors: Robin Taylor, Richard Holley, Austen Hearn
  • Publication number: 20120179380
    Abstract: A measurement apparatus comprises a probe system (100) operably coupled, when in use, to a processing resource (134). The probe system (100) and the processing resource (134) are arranged, when in use, to measure an apparent thickness change of a volume of the medium (108) to be measured and to determine a physiological parameter using the measurement of the apparent thickness change.
    Type: Application
    Filed: February 9, 2009
    Publication date: July 12, 2012
    Applicant: Lein Applied Diagnostics Limited
    Inventors: Robin Taylor, Richard Holley, Austen Hearn
  • Patent number: 8011785
    Abstract: An optical measurement apparatus comprises an optical system. The optical system comprises a source and an image capture device. The source is arranged to generate, when in use, a beam of electromagnetic radiation. Further, the optical system is arranged to direct the beam of electromagnetic radiation to a location to be measured. The optical measurement apparatus also comprises a feedback arrangement arranged to receive a reflected beam from the location to be measured and to provide feedback information in response to receipt of the reflected beam, the feedback information being indicative of degree of alignment of the location to be measured with the optical system.
    Type: Grant
    Filed: July 29, 2008
    Date of Patent: September 6, 2011
    Assignee: Lein Applied Diagnostics
    Inventors: Austen Hearn, Simon Meadowcroft, Richard Holley
  • Publication number: 20100220289
    Abstract: An optical measurement apparatus comprises an optical system (100). The optical system (100) comprises a source (102) and an image capture device (112). The source (102) is arranged to generate, when in use, a beam of electromagnetic radiation. Further, the optical system (100) is arranged to direct the beam of electromagnetic radiation to a location to be measured (132). The optical measurement apparatus also comprises a feedback arrangement (400, 602, 604) arranged to receive a reflected beam from the location to be measured and to provide feedback information in response to receipt of the reflected beam, the feedback information being indicative of degree of alignment of the location to be measured with the optical system.
    Type: Application
    Filed: July 29, 2008
    Publication date: September 2, 2010
    Inventors: Austen Hearn, Simon Meadowcroft
  • Publication number: 20100210925
    Abstract: An optical measurement apparatus comprises an optical system (100). The optical system (100) includes a source (102) and a detector (112). The source, when in use, emits a probe beam (116) and the optical system is arranged to direct the probe beam (116) to a location to be measured (114). The detector (112) is arranged to receive a reflected beam (120) from the location to be measured (114).The optical system (100) has a receiving numerical aperture associated therewith and is also arranged so that the probe beam (116) has a probe cone angle corresponding to a probe numerical aperture. The receiving numerical aperture is greater than the probe numerical aperture. Alternatively or additionally, the optical system (100) is arranged to apply a magnification ratio between the detector (112) and the location to be measured (114) so as to minimise deviation of the reflected beam from a receiving axis (119) of the optical system (100).
    Type: Application
    Filed: July 29, 2008
    Publication date: August 19, 2010
    Inventors: Richard Holley, Austen Hearn