Patents by Inventor Avadhut Dipakrao CHAUDHARI

Avadhut Dipakrao CHAUDHARI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for virtually executing an operation of an energy dispersive X-ray spectrometry (EDS) system in real-time production line
    Patent number: 11639906
    Abstract: Provided is a method for virtually executing an operation of an energy dispersive x-ray spectrometry (EDS) system in real time production line by analyzing a defect included in a material undergoing inspection based on computer vision, the method including receiving a scanning electron microscope (SEM) image of the material including the defect, extracting an image-feature from the SEM image of the material, classifying the extracted image-feature under a predetermined label, predicting, based on the classified image-feature, an element associated with the defect included in the material and a shape of the predicted element, and grading the defect included in the material based on comparing the predicted element with a predetermined criteria.
    Type: Grant
    Filed: February 25, 2021
    Date of Patent: May 2, 2023
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Shashank Shrikant Agashe, Gaurav Kumar, Priya Ranjan Sinha, Lakshmi Narayana Pedapudi, Avadhut Dipakrao Chaudhari, Dongwoo Lee, Taehyoung Lee
  • METHOD AND SYSTEM FOR VIRTUALLY EXECUTING AN OPERATION OF AN ENERGY DISPERSIVE X-RAY SPECTROMETRY (EDS) SYSTEM IN REAL-TIME PRODUCTION LINE
    Publication number: 20220163467
    Abstract: Provided is a method for virtually executing an operation of an energy dispersive x-ray spectrometry (EDS) system in real time production line by analyzing a defect included in a material undergoing inspection based on computer vision, the method including receiving a scanning electron microscope (SEM) image of the material including the defect, extracting an image-feature from the SEM image of the material; classifying the extracted image-feature under a predetermined label, predicting, based on the classified image-feature, an element associated with the defect included in the material and a shape of the predicted element, and grading the defect included in the material based on comparing the predicted element with a predetermined criteria.
    Type: Application
    Filed: February 25, 2021
    Publication date: May 26, 2022
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Shashank Shrikant AGASHE, Gaurav KUMAR, Priya Ranjan SINHA, Lakshmi Narayana PEDAPUDI, Avadhut Dipakrao CHAUDHARI, Dongwoo LEE, Taehyoung LEE