Abstract: Disclosed a method of treating a disease or a disorder characterized by protease activity. A pharmaceutical composition for treating a disease or a disorder characterized by protease activity is further disclosed. A method of detecting a cysteine protease from a biological sample is also disclosed.

Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

Abstract: The current invention provides therapeutic methods which include inhibition of nuclear factor ?b pathway in a cell based on the discovery of an active fraction of a plant extract termed NUP or a composition which includes NUP. NUP is used in treating and managing different diseases such as cancer, inflammation, and virus infections.

Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

Abstract: The current invention provides therapeutic methods which include inhibition of nuclear factor ?b pathway in a cell based on the discovery of an active fraction of a plant extract termed NUP or a composition which includes NUP. NUP is used in treating and managing different diseases such as cancer, inflammation, and virus infections.

Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

Abstract: A system, method, and computer-accessible medium are disclosed for maintaining data at a plurality of summary levels in a single table. Data may be summarized into a plurality of summary levels. Each of the summary levels may comprise summarized data over a respective one of a plurality of intervals of time. The plurality of summary levels may vary in granularity of the summarized data. The summarized data in the plurality of summary levels may be stored in a single table in a database.

Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

Abstract: Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.

Abstract: Parallel dies testing, mostly implemented on memory ICs—Integrated Circuits, significantly reduced overall test time. In order to minimize the need for physical probing, wafer probe card technology to allow simultaneous probing, ATE—Automated Test Equipment with enough channels and CPU power to handle the parallel testing. While new devices are designed with enough channels, and probe cards are designed and manufactured for each new device, the need to purchase new ATE to benefit from the technology is a heavy burden on parallel testing. It is proposed to interpose a multiplexer between the probe card and the ATE accompanied by a system that optimizes tester resources. The proposed system will allow test houses to benefit most from their investment without paying the full penalty of keeping less capable ATE.

Abstract: Parallel dies testing, mostly implemented on memory ICs—Integrated Circuits, significantly reduced overall test time. In order to minimize the need for physical probing, wafer probe card technology to allow simultaneous probing, ATE—Automated Test Equipment with enough channels and CPU power to handle the parallel testing. While new devices are designed with enough channels, and probe cards are designed and manufactured for each new device, the need to purchase new ATE to benefit from the technology is a heavy burden on parallel testing. It is proposed to interpose a multiplexer between the probe card and the ATE accompanied by a system that optimizes tester resources. The proposed system will allow test houses to benefit most from their investment without paying the full penalty of keeping less capable ATE.