Patents by Inventor Avishai Moshel

Avishai Moshel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrostatic ink compositions
    Patent number: 10344175
    Abstract: Herein is disclosed an electrostatic ink composition. In some examples, the electrostatic ink compositions comprise: a carrier liquid; a first resin; and a fluorescent pigment. The fluorescent pigment comprising a fluorescent dye and a second resin matrix, wherein the second resin is selected from the group comprising polyamide resins, polyvinylchlorides, polyolefin resins, polystyrenes, acrylonitrile-butadiene-styrene resins, polycarbonates, poly acrylic and methacrylic acid resins, polyethylene terephthalates, polyamide resins, polyurethanes, epoxy resins, silicone resins, polyester resins, alkyd resins, acrylonitrile polymers, polyesteramides or combinations thereof.
    Type: Grant
    Filed: July 17, 2015
    Date of Patent: July 9, 2019
    Assignee: HP Indigo B.V.
    Inventors: Biana Noikas, Dror Kella, Adi Vinegrad, Regina Guslitzer, Yaron Grinwald, Gil Bar-Haim, Tehila Ben-Ezra, Avishai Moshel, Emad Masoud, Yelena Litichevski, Roi Liraz, Noam Parvin
  • ELECTROSTATIC INK COMPOSITIONS
    Publication number: 20180155565
    Abstract: Herein is disclosed an electrostatic ink composition. In some examples, the electrostatic ink compositions comprise: a carrier liquid; a first resin; and a fluorescent pigment.
    Type: Application
    Filed: July 17, 2015
    Publication date: June 7, 2018
    Applicant: HP Indigo B.V.
    Inventors: Biana Noikas, Dror Kella, Adi Vinegrad, Regina Guslitzer, Yaron Grinwald, Gil Bar-Haim, Tehila Ben-Ezra, Avishai Moshel, Emad Masoud, Yelena Litichevski, Roi Liraz, Noam Parvin
  • CALCULATION OF LAYER THICKNESS
    Publication number: 20180120094
    Abstract: Processing circuitry includes circuitry to receive data, where the data is indicative of a measurement of a region of a substrate, the region having a first layer, and a second layer, and the first and second layers are provided one above the other with respect to the substrate. The measurement being indicative of an optical parameter associated with the first layer. The processing circuitry further includes circuitry to calculate a thickness of the second layer based on the received data.
    Type: Application
    Filed: July 31, 2015
    Publication date: May 3, 2018
    Applicant: HP INDIGO B.V.
    Inventor: Avishai Moshel