Abstract: A universal, fixtureless automatic test equipment is provided, capable of accessing opposite surfaces of any workpiece, simultaneously, for functionality testing. The workpiece can be freely placed anywhere on the test area, regardless of orientation, without the need for pre-test registration, alignment, or any kind of securing means. The test area of a universal fixtureless automatic test equipment, according to the teachings of the present invention, is made up of Independent Test Modules (ITMs). A test area may be configured from any number of ITMs, as desired. The ITMs can be individually selected for testing various functions of a respective section of a workpiece under test, and for independent electrical functioning. A typical ITM is made up of a plurality of semiconductor dies. Dies are similarly structured with matrices of selectable memorized bidirectional switching cells. Each switching cell is connected to a terminal-pad on the surface of the die.

Abstract: Fixtureless automatic test equipment for testing a printed wiring board having electrically conductive elements. The automatic test equipment of the present invention includes an array of modular integrated switching circuit (MISC) devices and test instrumentation fore determining the functionality of a workpiece. Each MISC includes an array of semiconductor dies mounted on a PWB interconnector for kiss touch deployment on a workpiece. All the PWB interconnectors form a test mattress of probes for deployment against a bare workpiece. Each semiconductor die includes a matrix of switching cells of which each switching cell terminates in a terminal. The PWB interconnector of each MISC connects the switching cell terminals to probes forming part of the test mattress.