Patents by Inventor Axel Engels

Axel Engels has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6989904
    Abstract: The method for determining local structures in optical materials, especially crystals, includes observing schlieren visually in a material to be tested with divergent white light in a first step; measuring birefringence of polarized laser light in the material to determine local defects and structure faults in the material with a spatial resolution of 0.5 mm or better in a second step if the material is judged to be suitable in the first step and then interferometrically measuring the material to determine the faults in the material by interferometry in a third step if the material is judged to be suitable in the first and second steps. This method can be part of a method for making optical components, especially for microlithography.
    Type: Grant
    Filed: June 18, 2003
    Date of Patent: January 24, 2006
    Assignee: Schott AG
    Inventors: Ewald Moersen, Axel Engel, Christian Lemke, Guenter Grabosch
  • Publication number: 20050253113
    Abstract: A white cold light source uses an LED or a gas discharge lamp and a luminescent rare earth doped glass comprising multiple rare earth cations and a particularly high total rare earth content to generate white light emission. Preferably, the luminescent glass has a 2700K to 7000K black body temperature and color rendering index value exceeding 80. A first embodiment of the glass is composed primarily of P2O5, Al2O3, and alkaline earth and alkali metal oxides, and possesses other properties such as physical and thermal properties that are compatible with conventional melting, forming and other manufacturing steps. Other embodiments of the luminescent glass have a maximum water content of 0.1 wt-% and do not contain any boron. Also the luminescent glass is preferably free of water, boron oxides and nitrides. The luminescent glass can be used as a wavelength converter to produce bright white light emission when pumped by conventional commercially available blue and UV light emitting diode sources.
    Type: Application
    Filed: April 27, 2005
    Publication date: November 17, 2005
    Inventors: Martin Letz, Ulrich Peuchert, Markus Schweizer, Bernd Drapp, Wolfram Beier, Karina Seneschal, Axel Engel, Joseph Hayden, Carol Click
  • Publication number: 20040212302
    Abstract: A white cold light source uses an LED or a gas discharge lamp and a luminescent rare earth doped glass comprising multiple rare earth cations and a particularly high total rare earth content to generate white light emission. Preferably, the luminescent glass has a 2700K to 7000K black body temperature and color rendering index value exceeding 80. A first embodiment of the glass is composed primarily of P2O5, Al2O3, and alkaline earth and alkali earth oxides, and possesses other properties such as physical and thermal properties that are compatible with conventional melting, forming and other manufacturing steps. Other embodiments of the luminescent glass have a maximum water content of 0.1 wt-% and do not contain any boron. Also the luminescent glass is preferably free of water, boron oxides and nitrides. The luminescent glass can be used as a wavelength converter to produce bright white light emission when pumped by conventional commercially available blue and UV light emitting diode sources.
    Type: Application
    Filed: March 11, 2004
    Publication date: October 28, 2004
    Inventors: Martin Letz, Ulrich Peuchert, Markus Schweizer, Bernd Drapp, Wolfram Beier, Karina Seneschal, Axel Engel, Joseph S. Hayden, Carol Click
  • Publication number: 20040021803
    Abstract: The method for determining local structures in optical materials, especially crystals, includes observing schlieren visually in a material to be tested with divergent white light in a first step; measuring birefringence of polarized laser light in the material to determine local defects and structure faults in the material with a spatial resolution of 0.5 mm or better in a second step if the material is judged to be suitable in the first step and then interferometrically measuring the material to determine the faults in the material by interferometry in a third step if the material is judged to be suitable in the first and second steps. This method can be part of a method for making optical components, especially for microlithography.
    Type: Application
    Filed: June 18, 2003
    Publication date: February 5, 2004
    Inventors: Ewald Moersen, Axel Engel, Christian Lemke, Guenter Grabosch