Patents by Inventor AZMAT H. SIDDIQI

AZMAT H. SIDDIQI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for detecting and/or identifying materials based on electromagnetic radiation
    Patent number: 8890073
    Abstract: One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material.
    Type: Grant
    Filed: March 28, 2012
    Date of Patent: November 18, 2014
    Assignee: Northrop Grumman Guidance and Electronics Company, Inc.
    Inventors: Mostafa A. Karam, A. Douglas Meyer, Charles H. Volk, Azmat H. Siddiqi
  • SYSTEMS AND METHODS FOR DETECTING AND/OR IDENTIFYING MATERIALS BASED ON ELECTROMAGNETIC RADIATION
    Publication number: 20120248314
    Abstract: One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material.
    Type: Application
    Filed: March 28, 2012
    Publication date: October 4, 2012
    Inventors: MOSTAFA A. KARAM, A. DOUGLAS MEYER, CHARLES H. VOLK, AZMAT H. SIDDIQI