Abstract: An embodiment of a method to characterize a die is disclosed. The embodiment of the method includes measuring a quality metric of the die, and determining, prior to a final test stage, whether the quality metric of the die satisfies a first constraint, where the first constraint is more stringent than a second constraint at the final test stage for the quality metric of the die.

Abstract: Methods of using one of a plurality of configuration bitstreams in an integrated circuit are disclosed. An exemplary method comprises analyzing the plurality of implementations of a design to determine initial variations in timing among the implementations; modifying the implementations to reduce the variations in timing among the implementations; and outputting a plurality of configuration bitstreams for the implementations having variations in timing that are reduced relative to the initial variations in timing. Another method comprises generating a plurality of implementations for the design; generating a cost function for the design based upon costs (e.g.