Patents by Inventor Babatunde Ashiru

Babatunde Ashiru has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for semiconductor yield loss calculation
    Patent number: 6717431
    Abstract: A method of calculating yield loss of semiconductor wafers which are tested with a test sequence to derive a total fail region count for each of the wafers, the semiconductor wafers having multiple chips thereon. The method comprises calculating a fail region count for each of the tests in the test sequence, calculating the test sequence limited yield loss for each of the wafers, and apportioning the test sequence limited yield loss to selected ones of the test based upon the absolute or cumulative number of fails identified by the tests of the test sequence. In some embodiments, core parametric test data is correlated with the test sequence limited yield and analyzed to determine reparability.
    Type: Grant
    Filed: May 2, 2002
    Date of Patent: April 6, 2004
    Assignee: Infineon Technologies Richmond, LP
    Inventors: Dieter Rathei, Joerg Wohlfahrt, Luis G. Andrade, Robert Petter, Thomas S. Taylor, Babatunde Ashiru, Mark E. Luzar, Michael B. Sommer, Ulrich K. Zimmermann
  • Method for semiconductor yield loss calculation
    Publication number: 20030207474
    Abstract: A method of calculating yield loss of semiconductor wafers which are tested with a test sequence to derive a total fail region count for each of the wafers, the semiconductor wafers having multiple chips thereon. The method comprises calculating a fail region count for each of the tests in the test sequence, calculating the test sequence limited yield loss for each of the wafers, and apportioning the test sequence limited yield loss to selected ones of the test based upon the absolute or cumulative number of fails identified by the tests of the test sequence. In some embodiments, core parametric test data is correlated with the test sequence limited yield and analyzed to determine reparability.
    Type: Application
    Filed: May 2, 2002
    Publication date: November 6, 2003
    Applicant: Infineon Technologies North America Corp.
    Inventors: Dieter Rathei, Joerg Wohlfahrt, Luis G. Andrade, Robert Petter, Thomas S. Taylor, Babatunde Ashiru, Mark E. Luzar, Michael B. Sommer, Ulrich K. Zimmermann