Patents by Inventor Baek Young LEE

Baek Young LEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11816579
    Abstract: A method for clustering based on unsupervised learning according to an embodiment of the invention enables clustering for newly generated patterns and is robust against noise, and does not require tagging for training data. According to one or more embodiments, noise is accurately removed using three-dimensional stacked spatial auto-correlation, and multivariate spatial probability distribution values and polar coordinate system spatial probability distribution values are used as learning features for clustering model generation, making them robust to noise, rotation, and fine unusual shapes. In addition, clusters resulting from clustering are classified into multi-level clusters, and stochastic automatic evaluation of normal/defect clusters is possible only with measurement data without a label.
    Type: Grant
    Filed: January 17, 2023
    Date of Patent: November 14, 2023
    Assignee: SAMSUNG SDS CO., LTD.
    Inventors: Min Sik Chu, Seong Mi Park, Jiin Jeong, Jae Hoon Kim, Kyong Hee Joo, Ho Geun Park, Baek Young Lee
  • Publication number: 20230177347
    Abstract: A method for clustering based on unsupervised learning according to an embodiment of the invention enables clustering for newly generated patterns and is robust against noise, and does not require tagging for training data. According to one or more embodiments, noise is accurately removed using three-dimensional stacked spatial auto-correlation, and multivariate spatial probability distribution values and polar coordinate system spatial probability distribution values are used as learning features for clustering model generation, making them robust to noise, rotation, and fine unusual shapes. In addition, clusters resulting from clustering are classified into multi-level clusters, and stochastic automatic evaluation of normal/defect clusters is possible only with measurement data without a label.
    Type: Application
    Filed: January 17, 2023
    Publication date: June 8, 2023
    Inventors: Min Sik CHU, Seong Mi PARK, Jiin JEONG, Jae Hoon KIM, Kyong Hee JOO, Ho Geun PARK, Baek Young LEE
  • Patent number: 11587222
    Abstract: A method for clustering based on unsupervised learning according to an embodiment of the invention enables clustering for newly generated patterns and is robust against noise, and does not require tagging for training data. According to one or more embodiments of the invention, noise is accurately removed using three-dimensional stacked spatial auto-correlation, and multivariate spatial probability distribution values and polar coordinate system spatial probability distribution values are used as learning features for clustering model generation, making them robust to noise, rotation, and fine unusual shapes. In addition, clusters resulting from clustering are classified into multi-level clusters, and stochastic automatic evaluation of normal/defect clusters is possible only with measurement data without a label.
    Type: Grant
    Filed: May 27, 2020
    Date of Patent: February 21, 2023
    Assignee: SAMSUNG SDS CO., LTD.
    Inventors: Min Sik Chu, Seong Mi Park, Jiin Jeong, Jae Hoon Kim, Kyong Hee Joo, Ho Geun Park, Baek Young Lee
  • Publication number: 20200380655
    Abstract: A method for clustering based on unsupervised learning according to an embodiment of the invention enables clustering for newly generated patterns and is robust against noise, and does not require tagging for training data. According to one or more embodiments of the invention, noise is accurately removed using three-dimensional stacked spatial auto-correlation, and multivariate spatial probability distribution values and polar coordinate system spatial probability distribution values are used as learning features for clustering model generation, making them robust to noise, rotation, and fine unusual shapes. In addition, clusters resulting from clustering are classified into multi-level clusters, and stochastic automatic evaluation of normal/defect clusters is possible only with measurement data without a label.
    Type: Application
    Filed: May 27, 2020
    Publication date: December 3, 2020
    Inventors: Min Sik CHU, Seong Mi PARK, Jiin JEONG, Jae Hoon KIM, Kyong Hee JOO, Ho Geun PARK, Baek Young LEE