Patents by Inventor Ban-Hui Chen

Ban-Hui Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8417869
    Abstract: A hybrid storage apparatus including a non-volatile memory module, a hard disk module, and a hybrid storage medium controller is provided. The hybrid storage medium controller groups physical blocks of the non-volatile memory module into at least a storage area and a replacement area, and the hybrid storage medium controller configures a plurality of logical blocks for mapping to the physical blocks in the storage area and configures a plurality of logical disk addresses for mapping to physical disk addresses of the hard disk module. The hybrid storage medium controller further configures a plurality of logical access addresses to be accessed by a host system and initially maps a portion of the logical access addresses to the logical blocks and the other logical access addresses to a portion of the logical disk addresses. Accordingly, the hybrid storage apparatus can have improved data access performance and prolonged lifespan.
    Type: Grant
    Filed: October 18, 2010
    Date of Patent: April 9, 2013
    Assignee: Phison Electronics Corp.
    Inventor: Ban-Hui Chen
  • Publication number: 20120059972
    Abstract: A hybrid storage apparatus including a non-volatile memory module, a hard disk module, and a hybrid storage medium controller is provided. The hybrid storage medium controller groups physical bocks of the non-volatile memory module into at least a storage area and a replacement area, and the hybrid storage medium controller configures a plurality of logical blocks for mapping to the physical blocks in the storage area and configures a plurality of logical disk addresses for mapping to physical disk addresses of the hard disk module. The hybrid storage medium controller further configures a plurality of logical access addresses to be accessed by a host system and initially maps a portion of the logical access addresses to the logical blocks and the other logical access addresses to a portion of the logical disk addresses. Accordingly, the hybrid storage apparatus can have improved data access performance and prolonged lifespan.
    Type: Application
    Filed: October 18, 2010
    Publication date: March 8, 2012
    Applicant: PHISON ELECTRONICS CORP.
    Inventor: Ban-Hui Chen
  • Patent number: 8086919
    Abstract: A flash memory controller having a flash memory testing functions is provided, in which the flash memory controller includes a microprocessor unit, a flash memory interface unit, a host interface unit and a memory cell testing unit. The flash memory interface unit is configured for connecting a plurality of flash memory chips, where each flash memory chip has a plurality of flash memory dies and each flash memory die has a plurality of physical blocks. The host interface unit is configured for connecting a host system. The memory cell testing unit is configured for determining whether the physical blocks can be normally written, read and erased. Accordingly, the flash memory controller can perform a flash memory testing under a command of the host system and all the physical blocks of the flash memory chip can be tested during the flash memory testing.
    Type: Grant
    Filed: May 22, 2009
    Date of Patent: December 27, 2011
    Assignee: Phison Electronics Corp.
    Inventors: Ban-Hui Chen, Wei-Chen Teo, Min-Cheng Wang
  • Patent number: 7954019
    Abstract: A flash storage device and a testing method and a testing system for the flash storage device are provided. The testing system includes a testing apparatus and the flash storage device. The flash storage device includes a controller, a flash memory module, a plurality of peripheral pins and at least one test pin. The flash storage device receives an enable signal transmitted from the testing apparatus through the test pin. Subsequently, the controller outputs a signal to the testing apparatus through each peripheral pin based to the enable signal. Finally, the testing apparatus verifies the signal outputted by each peripheral pin.
    Type: Grant
    Filed: February 11, 2009
    Date of Patent: May 31, 2011
    Assignee: Phison Electronics Corp.
    Inventors: Ban-Hui Chen, Chih-Kang Yeh
  • Publication number: 20100241914
    Abstract: A flash memory controller having a flash memory testing functions is provided, in which the flash memory controller includes a microprocessor unit, a flash memory interface unit, a host interface unit and a memory cell testing unit. The flash memory interface unit is configured for connecting a plurality of flash memory chips, where each flash memory chip has a plurality of flash memory dies and each flash memory die has a plurality of physical blocks. The host interface unit is configured for connecting a host system. The memory cell testing unit is configured for determining whether the physical blocks can be normally written, read and erased. Accordingly, the flash memory controller can perform a flash memory testing under a command of the host system and all the physical blocks of the flash memory chip can be tested during the flash memory testing.
    Type: Application
    Filed: May 22, 2009
    Publication date: September 23, 2010
    Inventors: BAN-HUI CHEN, Wei-Chen Teo, Min-Cheng Wang
  • Publication number: 20100156448
    Abstract: A flash storage device and a testing method and a testing system for the flash storage device are provided. The testing system includes a testing apparatus and the flash storage device. The flash storage device includes a controller, a flash memory module, a plurality of peripheral pins and at least one test pin. The flash storage device receives an enable signal transmitted from the testing apparatus through the test pin. Subsequently, the controller outputs a signal to the testing apparatus through each peripheral pin based to the enable signal. Finally, the testing apparatus verifies the signal outputted by each peripheral pin.
    Type: Application
    Filed: February 11, 2009
    Publication date: June 24, 2010
    Applicant: PHISON ELECTRONICS CORP.
    Inventors: Ban-Hui Chen, Chih-Kang Yeh
  • Patent number: 7480582
    Abstract: A flash memory card test device with multiple interfaces is disclosed. The flash memory card test device comprises at least one connection interface adaptor board and a test circuit board. The test circuit board is adapted for determining a specification of a flash memory to be tested and transmitting a test signal to test the flash memory.
    Type: Grant
    Filed: December 19, 2006
    Date of Patent: January 20, 2009
    Assignee: Phison Electronics Corp.
    Inventor: Ban-Hui Chen