Patents by Inventor Bao Cong HIU

Bao Cong HIU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Evaluation method, combined evaluation method, evaluation apparatus, and combined evaluation apparatus
    Patent number: 11162993
    Abstract: The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method including: making a semiconductor device that is connected parallel to a load by a load cable, perform a switching operation; measuring common-mode current flowing through the load cable during the switching operation; and outputting an evaluation benchmark for radiated noise based on the common-mode current, and an evaluation apparatus are provided.
    Type: Grant
    Filed: January 29, 2019
    Date of Patent: November 2, 2021
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Hiroki Katsumata, Michio Tamate, Miwako Fujita, Tamiko Asano, Yuhei Suzuki, Takashi Kaimi, Yuta Sunasaka, Tadanori Yamada, Ryu Araki, Bao Cong Hiu
  • Evaluation method, estimation method, evaluation apparatus, and combined evaluation apparatus
    Patent number: 11143691
    Abstract: The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method and an evaluation apparatus are provided, including: causing a semiconductor device to perform a switching operation; measuring voltage variation occurring between main terminals of the semiconductor device during the switching operation; and outputting an evaluation benchmark for radiated noise of the semiconductor device based on the voltage variation. The outputting the evaluation benchmark may include calculating the voltage variation in the semiconductor device for each frequency component as the evaluation benchmark.
    Type: Grant
    Filed: January 29, 2019
    Date of Patent: October 12, 2021
    Assignee: FUJI ELECTRIC CO., LTD.
    Inventors: Hiroki Katsumata, Michio Tamate, Miwako Fujita, Tamiko Asano, Yuhei Suzuki, Takashi Kaimi, Yuta Sunasaka, Tadanori Yamada, Ryu Araki, Bao Cong Hiu
  • EVALUATION METHOD, ESTIMATION METHOD, EVALUATION APPARATUS, AND COMBINED EVALUATION APPARATUS
    Publication number: 20190170807
    Abstract: The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method and an evaluation apparatus are provided, including: causing a semiconductor device to perform a switching operation; measuring voltage variation occurring between main terminals of the semiconductor device during the switching operation; and outputting an evaluation benchmark for radiated noise of the semiconductor device based on the voltage variation. The outputting the evaluation benchmark may include calculating the voltage variation in the semiconductor device for each frequency component as the evaluation benchmark.
    Type: Application
    Filed: January 29, 2019
    Publication date: June 6, 2019
    Inventors: Hiroki KATSUMATA, Michio TAMATE, Miwako FUJITA, Tamiko ASANO, Yuhei SUZUKI, Takashi KAIMI, Yuta SUNASAKA, Tadanori YAMADA, Ryu ARAKI, Bao Cong HIU
  • EVALUATION METHOD, COMBINED EVALUATION METHOD, EVALUATION APPARATUS, AND COMBINED EVALUATION APPARATUS
    Publication number: 20190170798
    Abstract: The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method including: making a semiconductor device that is connected parallel to a load by a load cable, perform a switching operation; measuring common-mode current flowing through the load cable during the switching operation; and outputting an evaluation benchmark for radiated noise based on the common-mode current, and an evaluation apparatus are provided.
    Type: Application
    Filed: January 29, 2019
    Publication date: June 6, 2019
    Inventors: Hiroki KATSUMATA, Michio TAMATE, Miwako FUJITA, Tamiko ASANO, Yuhei SUZUKI, Takashi KAIMI, Yuta SUNASAKA, Tadanori YAMADA, Ryu ARAKI, Bao Cong HIU