Abstract: First and second data interfaces provide data transfer to and from a plurality of memory banks. The first data interface uses a first bus size and a first clock frequency. The second data interface uses a second bus size and a second clock frequency. The second bus size is an integer multiple of the first bus size. The first clock frequency is an integer multiple of the second clock frequency. A channelizer module segments data from the second data interface into data segments of the first bus size and transmits them to addressed ones of the plurality of memory banks using the first clock frequency. The channelizer module also receives data in accordance with the first bus size and first clock frequency from the plurality of memory banks, combines this data into the second bus size, and transmits the data to the second data interface using the second clock frequency.

Abstract: First and second data interfaces provide data transfer to and from a plurality of memory banks. The first data interface uses a first bus size and a first clock frequency. The second data interface uses a second bus size and a second clock frequency. The second bus size is an integer multiple of the first bus size. The first clock frequency is an integer multiple of the second clock frequency. A channelizer module segments data from the second data interface into data segments of the first bus size and transmits them to addressed ones of the plurality of memory banks using the first clock frequency. The channelizer module also receives data in accordance with the first bus size and first clock frequency from the plurality of memory banks, combines this data into the second bus size, and transmits the data to the second data interface using the second clock frequency.

Abstract: A continuity test circuit for a boundary pad includes a pull-up transistor electrically connected between the boundary pad and a first power supply, and a pull-down transistor electrically connected between the boundary pad and a first reference ground potential. A normal output conductor is electrically connected to have a same electrical state as the boundary pad during normal operation. A continuity test output conductor is electrically connected to have a same electrical state as the boundary pad during continuity test operation. Continuity testing control circuitry is defined to control the pull-up transistor, the pull-down transistor, and the normal output conductor during continuity test operation such that an electrical state present on the continuity test output conductor indicates a status of electrical continuity between the boundary pad and either a second power supply or a second reference ground potential to which the boundary pad should be electrically connected.

Abstract: A soft-function trigger state machine includes state machine logic defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern. The state machine logic is defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern. The state machine logic is also defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.

Abstract: A continuity test circuit for a boundary pad includes a pull-up transistor electrically connected between the boundary pad and a first power supply, and a pull-down transistor electrically connected between the boundary pad and a first reference ground potential. A normal output conductor is electrically connected to have a same electrical state as the boundary pad during normal operation. A continuity test output conductor is electrically connected to have a same electrical state as the boundary pad during continuity test operation. Continuity testing control circuitry is defined to control the pull-up transistor, the pull-down transistor, and the normal output conductor during continuity test operation such that an electrical state present on the continuity test output conductor indicates a status of electrical continuity between the boundary pad and either a second power supply or a second reference ground potential to which the boundary pad should be electrically connected.

Abstract: A soft-function trigger state machine includes state machine logic defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern. The state machine logic is defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern. The state machine logic is also defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.

Abstract: An integrated circuit chip includes a scan-in pin, a scan clock pin, and a test controller. The scan-in pin and the scan clock pin receive a test program for the type of test mode and a soft-reset pattern. A state machine is configured to direct sampling of a scan clock waveform provided through the scan clock pin as dictated by transitions of a scan-in waveform provided through the scan-in pin. The state machine identifies a bit match from the sampled scan clock waveform upon executing the soft-reset pattern. The identified bit match triggers a soft reset which eliminates the need for an extra reset pin, when testing in scan mode.

Abstract: A USB controller and method of implementing a full transfer automation mode is described. The USB controller may have a host interface module configured to generate hardware logic signals for communication to a backend module having buffer memory. The backend module may be configured to generate hardware logic signals for communication with the host interface module such that data transfer within the USB device may be implemented without the need for processor intervention to handle routing of data packets during a USB bulk data transfer.

Abstract: An integrated circuit chip having testing logic for testing circuitry of the integrated circuit chip is provided. The integrated circuit chip includes at least a scan-in pin, a scan clock pin, and a test controller. The test controller has test mode registers for storing a type of test mode to be executed, and the test controller accepting signals from the scan-in pin and the scan clock pin. The scan-in pin and the scan clock pin receiving a test program for the type of test mode and a soft-reset pattern. Also included is a state machine logic that is part of the integrated circuit chip. The state machine logic, during execution of the test program, being configured to direct sampling of a scan clock waveform provided through the scan clock pin as dictated by transitions of a scan-in waveform provided through the scan-in pin. The sampling by the state machine circuitry identifying a bit match from the sampled scan clock waveform upon executing the soft-reset pattern.

Abstract: A USB controller and method of implementing a full transfer automation mode is described. The USB controller may have a host interface module configured to generate hardware logic signals for communication to a backend module having buffer memory. The backend module may be configured to generate hardware logic signals for communication with the host interface module such that data transfer within the USB device may be implemented without the need for processor intervention to handle routing of data packets during a USB bulk data transfer.

Abstract: A USB controller and method of implementing a full transfer automation mode is described. The USB controller may have a host interface module configured to generate hardware logic signals for communication to a backend module having buffer memory. The backend module may be configured to generate hardware logic signals for communication with the host interface module such that data transfer within the USB device may be implemented without the need for processor intervention to handle routing of data packets during a USB bulk data transfer.