Patents by Inventor Baokun Lu

Baokun Lu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11327193
    Abstract: The present disclosure provides a method and a device for imaging diffracted waves based on azimuth-dip angle gathers and a storage medium, which relates to the technical field of seismic exploration, comprising firstly acquiring seismic data and generating target azimuth-dip angle gathers based on the seismic data, wherein the target azimuth-dip angle gathers are a set of all azimuth-dip angle gathers in which the Fresnel zones have been muted, and each of the azimuth-dip angle gathers represents a dip-angle gather corresponding to each azimuth angle; then detecting diffracted waves based on the target azimuth-dip angle gathers, and determining the type of the diffracted waves; and finally, imaging the diffracted waves based on the type of the diffracted waves to obtain a diffracted wave imaging result.
    Type: Grant
    Filed: July 19, 2021
    Date of Patent: May 10, 2022
    Assignee: Institute of Geology and Geophysics, Chinese Academy of Sciences
    Inventors: Linong Liu, Zhengwei Li, Baokun Lu, Jiangjie Zhang, Jianfeng Zhang
  • Publication number: 20220043175
    Abstract: The present disclosure provides a method and a device for imaging diffracted waves based on azimuth-dip angle gathers and a storage medium, which relates to the technical field of seismic exploration, comprising firstly acquiring seismic data and generating target azimuth-dip angle gathers based on the seismic data, wherein the target azimuth-dip angle gathers are a set of all azimuth-dip angle gathers in which the Fresnel zones have been muted, and each of the azimuth-dip angle gathers represents a dip-angle gather corresponding to each azimuth angle; then detecting diffracted waves based on the target azimuth-dip angle gathers, and determining the type of the diffracted waves; and finally, imaging the diffracted waves based on the type of the diffracted waves to obtain a diffracted wave imaging result.
    Type: Application
    Filed: July 19, 2021
    Publication date: February 10, 2022
    Inventors: Linong Liu, Zhengwei Li, Baokun Lu, Jiangjie Zhang, Jianfeng Zhang