Abstract: An apparatus and a computer-implemented method are provided for determining a location in a target image (T) of a site on a surface of a physical object using two or more reference images (I1, I2) of said physical object that have been obtained with a reference imaging device. Each of said two or more reference images includes said site on the surface of the physical object and was obtained with the reference imaging device having a different position and/or orientation relative to said physical object. The target image is obtained by a target imaging device and includes the site on the surface of the physical object. For each reference image, a set of feature mappings from the reference image to the target image is used to determine the epipolar geometry between the reference image and the target image, and a projection of the site from the reference image onto the target image is calculated from said epipolar geometry.

Abstract: An apparatus and a computer-implemented method are provided for determining a location in a target image (T) of a site on a surface of a physical object using two or more reference images (I1, I2) of said physical object that have been obtained with a reference imaging device. Each of said two or more reference images includes said site on the surface of the physical object and was obtained with the reference imaging device having a different position and/or orientation relative to said physical object. The target image is obtained by a target imaging device and includes the site on the surface of the physical object. For each reference image, a set of feature mappings from the reference image to the target image is used to determine the epipolar geometry between the reference image and the target image, and a projection of the site from the reference image onto the target image is calculated from said epipolar geometry.